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• Feature-oriented_scanning abstract "Feature-oriented scanning (FOS) is a method of precision measurement of surface topography with a scanning probe microscope in which surface features (objects) are used as reference points for microscope probe attachment. With FOS method, by passing from one surface feature to another located nearby, the relative distance between the features and the feature neighborhood topographies are measured. This approach allows to scan an intended area of a surface by parts and then reconstruct the whole image from the obtained fragments. Beside the mentioned, it is acceptable to use another name for the method – object-oriented scanning (OOS).Any topography element that looks like a hill or a pit in wide sense may be taken as a surface feature. Examples of surface features (objects) are: atoms, interstices, molecules, grains, nanoparticles, clusters, crystallites, quantum dots, nanoislets, pillars, pores, short nanowires, short nanorods, short nanotubes, viruses, bacteria, organelles, cells, etc.FOS is designed for high-precision measurement of surface topography (see Fig.) as well as other surface properties and characteristics. Moreover, in comparison with the conventional scanning, FOS allows obtaining a higher spatial resolution. Thanks to a number of techniques embedded in FOS, the distortions caused by thermal drifts and creeps are practically eliminated.FOS has the following fields of application: surface metrology, precise probe positioning, automatic surface characterization, automatic surface modification/stimulation, automatic manipulation of nanoobjects, nanotechnological processes of "bottom-up" assembly, coordinated control of analytical and technological probes in multiprobe instruments, control of atomic/molecular assemblers, control of probe nanolithographs, etc.".
• Feature-oriented_scanning thumbnail R._V._Lapshin,_Feature-oriented_scanning_(FOS),_Fig._1.png?width=300.
• Feature-oriented_scanning wikiPageExternalLink fos1996.
• Feature-oriented_scanning wikiPageID "8984619".
• Feature-oriented_scanning wikiPageRevisionID "578481410".
• Feature-oriented_scanning hasPhotoCollection Feature-oriented_scanning.
• Feature-oriented_scanning subject Category:Microscopes.
• Feature-oriented_scanning subject Category:Scanning_probe_microscopy.
• Feature-oriented_scanning type Artifact100021939.
• Feature-oriented_scanning type Device103183080.
• Feature-oriented_scanning type Instrument103574816.
• Feature-oriented_scanning type Instrumentality103575240.
• Feature-oriented_scanning type Magnifier103709206.
• Feature-oriented_scanning type Microscope103760671.
• Feature-oriented_scanning type Microscopes.
• Feature-oriented_scanning type Object100002684.
• Feature-oriented_scanning type PhysicalEntity100001930.
• Feature-oriented_scanning type ScientificInstrument104147495.
• Feature-oriented_scanning type Whole100003553.
• Feature-oriented_scanning comment "Feature-oriented scanning (FOS) is a method of precision measurement of surface topography with a scanning probe microscope in which surface features (objects) are used as reference points for microscope probe attachment. With FOS method, by passing from one surface feature to another located nearby, the relative distance between the features and the feature neighborhood topographies are measured.".
• Feature-oriented_scanning label "Feature-oriented scanning".
• Feature-oriented_scanning label "Особенность-ориентированное сканирование".
• Feature-oriented_scanning sameAs m.027s8yj.
• Feature-oriented_scanning sameAs Q4338202.
• Feature-oriented_scanning sameAs Q4338202.
• Feature-oriented_scanning sameAs Feature-oriented_scanning.
• Feature-oriented_scanning wasDerivedFrom Feature-oriented_scanning?oldid=578481410.
• Feature-oriented_scanning depiction R._V._Lapshin,_Feature-oriented_scanning_(FOS),_Fig._1.png.
• Feature-oriented_scanning isPrimaryTopicOf Feature-oriented_scanning.