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- Flying_probe abstract "Flying probe test systems are often used for only testing basic production, prototypes, and boards that present accessibility problems. Flying probe testing uses electro-mechanically controlled probes to access components on printed circuit assemblies (PCAs). Commonly used for test of analog components, analog signature analysis, and short/open circuits. They can be classified as in-circuit test (ICT) systems or as Manufacturing Defects Analyzers (MDAs). They provide an alternative to the bed-of-nails technique for contacting the components on printed circuit boards. The precision movement can probe points on PLCCs, SOICs, PGAs, SSOPs, QFPs and others, without any expensive fixturing or programming required.".
- Flying_probe wikiPageID "14326527".
- Flying_probe wikiPageRevisionID "551006624".
- Flying_probe hasPhotoCollection Flying_probe.
- Flying_probe subject Category:Electronic_test_equipment.
- Flying_probe subject Category:Hardware_testing.
- Flying_probe subject Category:Nondestructive_testing.
- Flying_probe comment "Flying probe test systems are often used for only testing basic production, prototypes, and boards that present accessibility problems. Flying probe testing uses electro-mechanically controlled probes to access components on printed circuit assemblies (PCAs). Commonly used for test of analog components, analog signature analysis, and short/open circuits. They can be classified as in-circuit test (ICT) systems or as Manufacturing Defects Analyzers (MDAs).".
- Flying_probe label "Flying probe".
- Flying_probe sameAs m.03d0m3v.
- Flying_probe sameAs Q5463595.
- Flying_probe sameAs Q5463595.
- Flying_probe wasDerivedFrom Flying_probe?oldid=551006624.
- Flying_probe isPrimaryTopicOf Flying_probe.