Matches in DBpedia 2014 for { <http://dbpedia.org/resource/Linnik_interferometer> ?p ?o. }
Showing items 1 to 25 of
25
with 100 items per page.
- Linnik_interferometer abstract "A Linnik interferometer is a two-beam interferometer used in microscopy and surface contour measurements or topography. The basic configuration is the same as a Michelson interferometer. What distinguishes the Linnik configuration is the use of measurement optics in the reference arm, which essentially duplicate the objective measurement optics in the measurement arm. The advantage of this design its ability to compensate for chromatic dispersion and other optical aberrations.In the image of a Linnik interferometer at right, 110 is the light source, 164 the detector. The beamsplitter 120 produces the two arms of the interferometer. The measurement arm 140 contains an objective lens 141 for imaging the surface to be studied 152. The reference arm 130 contains complementary optics to compensate for aberrations produced in the measurement arm.".
- Linnik_interferometer thumbnail US_Patent_7126698_B2.jpg?width=300.
- Linnik_interferometer wikiPageID "13330203".
- Linnik_interferometer wikiPageRevisionID "587717870".
- Linnik_interferometer hasPhotoCollection Linnik_interferometer.
- Linnik_interferometer subject Category:Interferometers.
- Linnik_interferometer type Artifact100021939.
- Linnik_interferometer type Device103183080.
- Linnik_interferometer type Instrument103574816.
- Linnik_interferometer type Instrumentality103575240.
- Linnik_interferometer type Interferometer103578981.
- Linnik_interferometer type Interferometers.
- Linnik_interferometer type MeasuringInstrument103733925.
- Linnik_interferometer type Object100002684.
- Linnik_interferometer type PhysicalEntity100001930.
- Linnik_interferometer type Whole100003553.
- Linnik_interferometer comment "A Linnik interferometer is a two-beam interferometer used in microscopy and surface contour measurements or topography. The basic configuration is the same as a Michelson interferometer. What distinguishes the Linnik configuration is the use of measurement optics in the reference arm, which essentially duplicate the objective measurement optics in the measurement arm.".
- Linnik_interferometer label "Linnik interferometer".
- Linnik_interferometer sameAs m.03c1xww.
- Linnik_interferometer sameAs Q6554628.
- Linnik_interferometer sameAs Q6554628.
- Linnik_interferometer sameAs Linnik_interferometer.
- Linnik_interferometer wasDerivedFrom Linnik_interferometer?oldid=587717870.
- Linnik_interferometer depiction US_Patent_7126698_B2.jpg.
- Linnik_interferometer isPrimaryTopicOf Linnik_interferometer.
