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- Negative-bias_temperature_instability abstract "Negative-bias temperature instability (NBTI) is a key reliability issue in MOSFETs. NBTI manifests as an increase in the threshold voltage and consequent decrease in drain current and transconductance of a MOSFET. The degradation exhibits logarithmic dependence on time. It is of immediate concern in p-channel MOS devices, since they almost always operate with negative gate-to-source voltage; however, the very same mechanism also affects nMOS transistors when biased in the accumulation regime, i.e. with a negative bias applied to the gate.".
- Negative-bias_temperature_instability wikiPageID "7048926".
- Negative-bias_temperature_instability wikiPageRevisionID "568508503".
- Negative-bias_temperature_instability subject Category:Electronic_engineering.
- Negative-bias_temperature_instability subject Category:Hardware_testing.
- Negative-bias_temperature_instability subject Category:Semiconductor_device_defects.
- Negative-bias_temperature_instability subject Category:Semiconductor_device_fabrication.
- Negative-bias_temperature_instability comment "Negative-bias temperature instability (NBTI) is a key reliability issue in MOSFETs. NBTI manifests as an increase in the threshold voltage and consequent decrease in drain current and transconductance of a MOSFET. The degradation exhibits logarithmic dependence on time.".
- Negative-bias_temperature_instability label "NBTI".
- Negative-bias_temperature_instability label "Negative-bias temperature instability".
- Negative-bias_temperature_instability sameAs NBTI.
- Negative-bias_temperature_instability sameAs m.0h1yq7.
- Negative-bias_temperature_instability sameAs Q6987194.
- Negative-bias_temperature_instability sameAs Q6987194.
- Negative-bias_temperature_instability wasDerivedFrom Negative-bias_temperature_instability?oldid=568508503.
- Negative-bias_temperature_instability isPrimaryTopicOf Negative-bias_temperature_instability.