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- Non-contact_atomic_force_microscopy abstract "Non-contact atomic force microscopy (nc-AFM) is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms) to the surface under study, the probe is then raster scanned across the surface, the image is then constructed from the force interactions during the scan. The probe is connected to a resonator, usually a silicon-cantilever or a quartz crystal resonator. During in measurements the sensor is driven so that it oscillates. The force interactions are measured either by measuring the change in amplitude of the oscillation at a constant frequency just off resonance (amplitude modulation) or by measuring the change in resonant frequency directly using a feedback circuit (usually a PLL) to always drive the sensor on resonance (frequency modulation).".
- Non-contact_atomic_force_microscopy wikiPageID "40476464".
- Non-contact_atomic_force_microscopy wikiPageRevisionID "602645115".
- Non-contact_atomic_force_microscopy subject Category:Intermolecular_forces.
- Non-contact_atomic_force_microscopy subject Category:Scanning_probe_microscopy.
- Non-contact_atomic_force_microscopy subject Category:Scientific_techniques.
- Non-contact_atomic_force_microscopy comment "Non-contact atomic force microscopy (nc-AFM) is a mode of atomic force microscopy, which itself is a type of scanning probe microscopy. In nc-AFM a sharp probe is moved close (order of Angstroms) to the surface under study, the probe is then raster scanned across the surface, the image is then constructed from the force interactions during the scan. The probe is connected to a resonator, usually a silicon-cantilever or a quartz crystal resonator.".
- Non-contact_atomic_force_microscopy label "Non-contact atomic force microscopy".
- Non-contact_atomic_force_microscopy sameAs m.0x16_q5.
- Non-contact_atomic_force_microscopy sameAs Q16029538.
- Non-contact_atomic_force_microscopy sameAs Q16029538.
- Non-contact_atomic_force_microscopy wasDerivedFrom Non-contact_atomic_force_microscopy?oldid=602645115.
- Non-contact_atomic_force_microscopy isPrimaryTopicOf Non-contact_atomic_force_microscopy.