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- Photoemission_electron_microscopy abstract "Photoemission Electron microscopy (PEEM, also called photoelectron microscopy, PEM) is a widely used type of emission microscopy. PEEM utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by UV light, synchrotron radiation or X-ray sources. PEEM measures the coefficient indirectly by collecting the emitted secondary electrons generated in the electron cascade that follows the creation of the primary core hole in the absorption process. PEEM is a surface sensitive technique because the emitted electrons originate from a very shallow layer. In physics, this technique is referred to as PEEM, which goes together naturally with low-energy electron diffraction (LEED), and low-energy electron microscopy (LEEM). In biology, it is called photoelectron microscopy (PEM), which fits with photoelectron spectroscopy (PES), transmission electron microscopy (TEM), and scanning electron microscopy (SEM).".
- Photoemission_electron_microscopy wikiPageExternalLink TutorialPEEM.shtml.
- Photoemission_electron_microscopy wikiPageID "803716".
- Photoemission_electron_microscopy wikiPageRevisionID "604463460".
- Photoemission_electron_microscopy hasPhotoCollection Photoemission_electron_microscopy.
- Photoemission_electron_microscopy subject Category:Microscopes.
- Photoemission_electron_microscopy type Artifact100021939.
- Photoemission_electron_microscopy type Device103183080.
- Photoemission_electron_microscopy type Instrument103574816.
- Photoemission_electron_microscopy type Instrumentality103575240.
- Photoemission_electron_microscopy type Magnifier103709206.
- Photoemission_electron_microscopy type Microscope103760671.
- Photoemission_electron_microscopy type Microscopes.
- Photoemission_electron_microscopy type Object100002684.
- Photoemission_electron_microscopy type PhysicalEntity100001930.
- Photoemission_electron_microscopy type ScientificInstrument104147495.
- Photoemission_electron_microscopy type Whole100003553.
- Photoemission_electron_microscopy comment "Photoemission Electron microscopy (PEEM, also called photoelectron microscopy, PEM) is a widely used type of emission microscopy. PEEM utilizes local variations in electron emission to generate image contrast. The excitation is usually produced by UV light, synchrotron radiation or X-ray sources. PEEM measures the coefficient indirectly by collecting the emitted secondary electrons generated in the electron cascade that follows the creation of the primary core hole in the absorption process.".
- Photoemission_electron_microscopy label "Photoemission electron microscopy".
- Photoemission_electron_microscopy sameAs m.03d7jj.
- Photoemission_electron_microscopy sameAs Q7187744.
- Photoemission_electron_microscopy sameAs Q7187744.
- Photoemission_electron_microscopy sameAs Photoemission_electron_microscopy.
- Photoemission_electron_microscopy wasDerivedFrom Photoemission_electron_microscopy?oldid=604463460.
- Photoemission_electron_microscopy isPrimaryTopicOf Photoemission_electron_microscopy.