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- Photonic_force_microscope abstract "Photonic force microscopy (PFM) is an optical-tweezers-based microscopy technique. A small dielectric particle (20 nm to several micrometres) is held by a strongly focused laser beam.The forward scattered light, i.e. the light whose orientation is slightly changed while passing through the particle, and unscattered light are collected by a lens and projected onto a Quadrant Photo-Diode (QPD), i.e. a Position sensitive device (PSD). These two components interfere in the detector and produce signals, which permit the detection of the bead's position in three dimensions. The precision is very good (as low as 0.1 nm) and the recording speed is very high (up to 1 MHz). Brownian motion deflects the bead from the resting position. A time sequence of measured positions allows one to derive the optical potential in which the particle is held.The PFM is sensitive to the environment of the particle and has been used in a variety of different experiments that e.g. monitor space that can be filled by particles inside agarose or the fate of small latex beads captured by macrophages.A similar concept of scanning a bead with and optical trap over a surface was invented in 1993 by Ghislain and W. W. Webb. The name of photonic force microscope was first used in 1997 by Ernst-Ludwig Florin, Arnd Pralle, J. Heinrich Hoerber and Ernst H.K. Stelzer during their stays at EMBL, when they developed 3D position detection and began using the Brownian motion as scanner.".
- Photonic_force_microscope wikiPageExternalLink art%253A10.1007%252Fs003390051102.pdf?auth66=1387051421_224ee037f525ca8b49522c3685020ef4&ext=.pdf.
- Photonic_force_microscope wikiPageExternalLink abstract.
- Photonic_force_microscope wikiPageExternalLink www.elliotscientific.com.
- Photonic_force_microscope wikiPageExternalLink www.jpk.com.
- Photonic_force_microscope wikiPageExternalLink 225181511_Photonic_force_microscope_calibration_by_thermal_noise_analysis.
- Photonic_force_microscope wikiPageID "2519203".
- Photonic_force_microscope wikiPageRevisionID "585794851".
- Photonic_force_microscope hasPhotoCollection Photonic_force_microscope.
- Photonic_force_microscope subject Category:Microscopes.
- Photonic_force_microscope subject Category:Scientific_techniques.
- Photonic_force_microscope type Artifact100021939.
- Photonic_force_microscope type Device103183080.
- Photonic_force_microscope type Instrument103574816.
- Photonic_force_microscope type Instrumentality103575240.
- Photonic_force_microscope type Magnifier103709206.
- Photonic_force_microscope type Microscope103760671.
- Photonic_force_microscope type Microscopes.
- Photonic_force_microscope type Object100002684.
- Photonic_force_microscope type PhysicalEntity100001930.
- Photonic_force_microscope type ScientificInstrument104147495.
- Photonic_force_microscope type Whole100003553.
- Photonic_force_microscope comment "Photonic force microscopy (PFM) is an optical-tweezers-based microscopy technique. A small dielectric particle (20 nm to several micrometres) is held by a strongly focused laser beam.The forward scattered light, i.e. the light whose orientation is slightly changed while passing through the particle, and unscattered light are collected by a lens and projected onto a Quadrant Photo-Diode (QPD), i.e. a Position sensitive device (PSD).".
- Photonic_force_microscope label "Photonic force microscope".
- Photonic_force_microscope sameAs m.07khv7.
- Photonic_force_microscope sameAs Q7187868.
- Photonic_force_microscope sameAs Q7187868.
- Photonic_force_microscope sameAs Photonic_force_microscope.
- Photonic_force_microscope wasDerivedFrom Photonic_force_microscope?oldid=585794851.
- Photonic_force_microscope isPrimaryTopicOf Photonic_force_microscope.