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- Reflection_high-energy_electron_diffraction abstract "Reflection high-energy electron diffraction (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that also rely on diffraction of high-energy electrons. Transmission electron microscopy, another common electron diffraction method samples the bulk of the sample due to the geometry of the system. Low-energy electron diffraction (LEED) is also surface sensitive, but LEED achieves surface sensitivity through the use of low energy electrons.".
- Reflection_high-energy_electron_diffraction thumbnail RHEED.svg?width=300.
- Reflection_high-energy_electron_diffraction wikiPageID "445637".
- Reflection_high-energy_electron_diffraction wikiPageRevisionID "591643740".
- Reflection_high-energy_electron_diffraction hasPhotoCollection Reflection_high-energy_electron_diffraction.
- Reflection_high-energy_electron_diffraction subject Category:Crystallography.
- Reflection_high-energy_electron_diffraction subject Category:Diffraction.
- Reflection_high-energy_electron_diffraction subject Category:Measuring_instruments.
- Reflection_high-energy_electron_diffraction subject Category:Spectroscopy.
- Reflection_high-energy_electron_diffraction type Artifact100021939.
- Reflection_high-energy_electron_diffraction type Device103183080.
- Reflection_high-energy_electron_diffraction type Instrument103574816.
- Reflection_high-energy_electron_diffraction type Instrumentality103575240.
- Reflection_high-energy_electron_diffraction type MeasuringInstrument103733925.
- Reflection_high-energy_electron_diffraction type MeasuringInstruments.
- Reflection_high-energy_electron_diffraction type Object100002684.
- Reflection_high-energy_electron_diffraction type PhysicalEntity100001930.
- Reflection_high-energy_electron_diffraction type Whole100003553.
- Reflection_high-energy_electron_diffraction comment "Reflection high-energy electron diffraction (RHEED) is a technique used to characterize the surface of crystalline materials. RHEED systems gather information only from the surface layer of the sample, which distinguishes RHEED from other materials characterization methods that also rely on diffraction of high-energy electrons. Transmission electron microscopy, another common electron diffraction method samples the bulk of the sample due to the geometry of the system.".
- Reflection_high-energy_electron_diffraction label "Diffraction d'électrons de haute énergie en incidence rasante".
- Reflection_high-energy_electron_diffraction label "RHEED".
- Reflection_high-energy_electron_diffraction label "Reflection high-energy electron diffraction".
- Reflection_high-energy_electron_diffraction label "Дифракция быстрых электронов".
- Reflection_high-energy_electron_diffraction label "反射高速電子線回折".
- Reflection_high-energy_electron_diffraction sameAs RHEED.
- Reflection_high-energy_electron_diffraction sameAs Diffraction_d'électrons_de_haute_énergie_en_incidence_rasante.
- Reflection_high-energy_electron_diffraction sameAs 反射高速電子線回折.
- Reflection_high-energy_electron_diffraction sameAs m.029c86.
- Reflection_high-energy_electron_diffraction sameAs Q455003.
- Reflection_high-energy_electron_diffraction sameAs Q455003.
- Reflection_high-energy_electron_diffraction sameAs Reflection_high-energy_electron_diffraction.
- Reflection_high-energy_electron_diffraction wasDerivedFrom Reflection_high-energy_electron_diffraction?oldid=591643740.
- Reflection_high-energy_electron_diffraction depiction RHEED.svg.
- Reflection_high-energy_electron_diffraction isPrimaryTopicOf Reflection_high-energy_electron_diffraction.
