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- Scanning_confocal_electron_microscopy abstract "Scanning confocal electron microscopy (SCEM) is an electron microscopy technique analogous to scanning confocal optical microscopy (SCOM). In this technique, the studied sample is illuminated by a focussed electron beam, as in other scanning microscopy techniques, such as scanning transmission electron microscopy or scanning electron microscopy. However, in SCEM, the collection optics is arranged symmetrically to the illumination optics to gather only the electrons that pass the beam focus. This results in superior depth resolution of the imaging. The technique is relatively new and is being actively developed.".
- Scanning_confocal_electron_microscopy thumbnail SCEM.JPG?width=300.
- Scanning_confocal_electron_microscopy wikiPageID "19408628".
- Scanning_confocal_electron_microscopy wikiPageRevisionID "605017799".
- Scanning_confocal_electron_microscopy hasPhotoCollection Scanning_confocal_electron_microscopy.
- Scanning_confocal_electron_microscopy subject Category:Electron_microscopy.
- Scanning_confocal_electron_microscopy subject Category:Scientific_techniques.
- Scanning_confocal_electron_microscopy type Ability105616246.
- Scanning_confocal_electron_microscopy type Abstraction100002137.
- Scanning_confocal_electron_microscopy type Cognition100023271.
- Scanning_confocal_electron_microscopy type Know-how105616786.
- Scanning_confocal_electron_microscopy type Method105660268.
- Scanning_confocal_electron_microscopy type PsychologicalFeature100023100.
- Scanning_confocal_electron_microscopy type ScientificTechniques.
- Scanning_confocal_electron_microscopy type Technique105665146.
- Scanning_confocal_electron_microscopy comment "Scanning confocal electron microscopy (SCEM) is an electron microscopy technique analogous to scanning confocal optical microscopy (SCOM). In this technique, the studied sample is illuminated by a focussed electron beam, as in other scanning microscopy techniques, such as scanning transmission electron microscopy or scanning electron microscopy. However, in SCEM, the collection optics is arranged symmetrically to the illumination optics to gather only the electrons that pass the beam focus.".
- Scanning_confocal_electron_microscopy label "Microscópio eletrônico confocal de varredura".
- Scanning_confocal_electron_microscopy label "Scanning confocal electron microscopy".
- Scanning_confocal_electron_microscopy sameAs Microscópio_eletrônico_confocal_de_varredura.
- Scanning_confocal_electron_microscopy sameAs m.04m_sg3.
- Scanning_confocal_electron_microscopy sameAs Q7430074.
- Scanning_confocal_electron_microscopy sameAs Q7430074.
- Scanning_confocal_electron_microscopy sameAs Scanning_confocal_electron_microscopy.
- Scanning_confocal_electron_microscopy wasDerivedFrom Scanning_confocal_electron_microscopy?oldid=605017799.
- Scanning_confocal_electron_microscopy depiction SCEM.JPG.
- Scanning_confocal_electron_microscopy isPrimaryTopicOf Scanning_confocal_electron_microscopy.
