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- Scanning_electron_microscope abstract "A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that can be detected and that contain information about the sample's surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image. SEM can achieve resolution better than 1 nanometer. Specimens can be observed in high vacuum, in low vacuum, and (in environmental SEM) in wet conditions.The most common mode of detection is by secondary electrons emitted by atoms excited by the electron beam. The number of secondary electrons is a function of the angle between the surface and the beam.[citation needed] On a flat surface, the plume of secondary electrons is mostly contained by the sample, but on a tilted surface, the plume is partially exposed and more electrons are emitted. By scanning the sample and detecting the secondary electrons, an image displaying the tilt of the surface is created.".
- Scanning_electron_microscope thumbnail Misc_pollen.jpg?width=300.
- Scanning_electron_microscope wikiPageExternalLink history.html.
- Scanning_electron_microscope wikiPageExternalLink imagesindex.html.
- Scanning_electron_microscope wikiPageExternalLink EM_tutorial.
- Scanning_electron_microscope wikiPageExternalLink esem-prep.mov.
- Scanning_electron_microscope wikiPageExternalLink sparkler.php.
- Scanning_electron_microscope wikiPageExternalLink www.danilatos.com.
- Scanning_electron_microscope wikiPageExternalLink colrESEM317.html.
- Scanning_electron_microscope wikiPageExternalLink scancol09.html.
- Scanning_electron_microscope wikiPageExternalLink scanning-electron-microscope.htm.
- Scanning_electron_microscope wikiPageExternalLink semindex.htm.
- Scanning_electron_microscope wikiPageExternalLink watch?v=GY9lfO-tVfE.
- Scanning_electron_microscope wikiPageExternalLink sbertazz.
- Scanning_electron_microscope wikiPageID "28034".
- Scanning_electron_microscope wikiPageRevisionID "604285935".
- Scanning_electron_microscope by "no".
- Scanning_electron_microscope hasPhotoCollection Scanning_electron_microscope.
- Scanning_electron_microscope label "Scanning electron microscopy".
- Scanning_electron_microscope lcheading "Scanning electron microscopy".
- Scanning_electron_microscope onlinebooks "no".
- Scanning_electron_microscope subject Category:Electron_microscopy.
- Scanning_electron_microscope subject Category:Scientific_techniques.
- Scanning_electron_microscope type Ability105616246.
- Scanning_electron_microscope type Abstraction100002137.
- Scanning_electron_microscope type Cognition100023271.
- Scanning_electron_microscope type Know-how105616786.
- Scanning_electron_microscope type Method105660268.
- Scanning_electron_microscope type PsychologicalFeature100023100.
- Scanning_electron_microscope type ScientificTechniques.
- Scanning_electron_microscope type Technique105665146.
- Scanning_electron_microscope comment "A scanning electron microscope (SEM) is a type of electron microscope that produces images of a sample by scanning it with a focused beam of electrons. The electrons interact with atoms in the sample, producing various signals that can be detected and that contain information about the sample's surface topography and composition. The electron beam is generally scanned in a raster scan pattern, and the beam's position is combined with the detected signal to produce an image.".
- Scanning_electron_microscope label "Elektronowy mikroskop skaningowy".
- Scanning_electron_microscope label "Microscopie électronique à balayage".
- Scanning_electron_microscope label "Microscopio electrónico de barrido".
- Scanning_electron_microscope label "Microscopio elettronico a scansione".
- Scanning_electron_microscope label "Microscópio eletrônico de varredura".
- Scanning_electron_microscope label "Rasterelektronenmicroscoop".
- Scanning_electron_microscope label "Rasterelektronenmikroskop".
- Scanning_electron_microscope label "Scanning electron microscope".
- Scanning_electron_microscope label "Растровый электронный микроскоп".
- Scanning_electron_microscope label "مجهر إلكتروني ماسح".
- Scanning_electron_microscope label "扫描电子显微镜".
- Scanning_electron_microscope label "走査型電子顕微鏡".
- Scanning_electron_microscope sameAs Rastrovací_elektronový_mikroskop.
- Scanning_electron_microscope sameAs Rasterelektronenmikroskop.
- Scanning_electron_microscope sameAs Ηλεκτρονικό_μικροσκόπιο_σάρωσης.
- Scanning_electron_microscope sameAs Microscopio_electrónico_de_barrido.
- Scanning_electron_microscope sameAs Microscopie_électronique_à_balayage.
- Scanning_electron_microscope sameAs Microscopio_elettronico_a_scansione.
- Scanning_electron_microscope sameAs 走査型電子顕微鏡.
- Scanning_electron_microscope sameAs Rasterelektronenmicroscoop.
- Scanning_electron_microscope sameAs Elektronowy_mikroskop_skaningowy.
- Scanning_electron_microscope sameAs Microscópio_eletrônico_de_varredura.
- Scanning_electron_microscope sameAs m.06zhw.
- Scanning_electron_microscope sameAs Q321095.
- Scanning_electron_microscope sameAs Q321095.
- Scanning_electron_microscope sameAs Scanning_electron_microscope.
- Scanning_electron_microscope wasDerivedFrom Scanning_electron_microscope?oldid=604285935.
- Scanning_electron_microscope depiction Misc_pollen.jpg.
- Scanning_electron_microscope isPrimaryTopicOf Scanning_electron_microscope.
