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- Secondary_ion_mass_spectrometry abstract "Secondary ion mass spectrometry (SIMS) is a technique developed in the 1960s by the french company CAMECA S.A.S and used in materials sciences and surface sciences to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions. The mass/charge ratios of these secondary ions are measured with a mass spectrometer to determine the elemental, isotopic, or molecular composition of the surface to a depth of 1 to 2 nm. Due to the large variation in ionization probabilities among different materials, SIMS is generally considered to be a qualitative technique, although quantitation is possible with the use of standards. SIMS is the most sensitive surface analysis technique, with elemental detection limits ranging from parts per million to parts per billion.".
- Secondary_ion_mass_spectrometry thumbnail IMS3F_pbmf.JPG?width=300.
- Secondary_ion_mass_spectrometry wikiPageExternalLink index.html.
- Secondary_ion_mass_spectrometry wikiPageExternalLink index.html.
- Secondary_ion_mass_spectrometry wikiPageExternalLink sims_instrumentation_tutorial.
- Secondary_ion_mass_spectrometry wikiPageExternalLink index.php.
- Secondary_ion_mass_spectrometry wikiPageExternalLink www.simsworkshop.org.
- Secondary_ion_mass_spectrometry wikiPageExternalLink literature.htm.
- Secondary_ion_mass_spectrometry wikiPageID "651485".
- Secondary_ion_mass_spectrometry wikiPageRevisionID "597956263".
- Secondary_ion_mass_spectrometry acronym "SIMS".
- Secondary_ion_mass_spectrometry analytes "Solid surfaces, thin films".
- Secondary_ion_mass_spectrometry caption "CAMECA IMS 3f Magnetic SIMS Instrument".
- Secondary_ion_mass_spectrometry classification "Mass spectrometry".
- Secondary_ion_mass_spectrometry hasPhotoCollection Secondary_ion_mass_spectrometry.
- Secondary_ion_mass_spectrometry name "Secondary Ion Mass Spectrometry".
- Secondary_ion_mass_spectrometry related Fast_atom_bombardment.
- Secondary_ion_mass_spectrometry related Microprobe.
- Secondary_ion_mass_spectrometry subject Category:Mass_spectrometry.
- Secondary_ion_mass_spectrometry subject Category:Semiconductor_analysis.
- Secondary_ion_mass_spectrometry type Abstraction100002137.
- Secondary_ion_mass_spectrometry type Act100030358.
- Secondary_ion_mass_spectrometry type Activity100407535.
- Secondary_ion_mass_spectrometry type Analysis100634276.
- Secondary_ion_mass_spectrometry type ChemicalAnalysis100646833.
- Secondary_ion_mass_spectrometry type Event100029378.
- Secondary_ion_mass_spectrometry type Investigation100633864.
- Secondary_ion_mass_spectrometry type PsychologicalFeature100023100.
- Secondary_ion_mass_spectrometry type Work100575741.
- Secondary_ion_mass_spectrometry type YagoPermanentlyLocatedEntity.
- Secondary_ion_mass_spectrometry comment "Secondary ion mass spectrometry (SIMS) is a technique developed in the 1960s by the french company CAMECA S.A.S and used in materials sciences and surface sciences to analyze the composition of solid surfaces and thin films by sputtering the surface of the specimen with a focused primary ion beam and collecting and analyzing ejected secondary ions.".
- Secondary_ion_mass_spectrometry label "Secondary ion mass spectrometry".
- Secondary_ion_mass_spectrometry label "Sekundärionen-Massenspektrometrie".
- Secondary_ion_mass_spectrometry label "Spectrométrie de masse à ionisation secondaire".
- Secondary_ion_mass_spectrometry label "Spettrometria di massa di ioni secondari".
- Secondary_ion_mass_spectrometry label "ToF-SIMS".
- Secondary_ion_mass_spectrometry label "Масс-спектрометрия вторичных ионов".
- Secondary_ion_mass_spectrometry label "二次イオン質量分析法".
- Secondary_ion_mass_spectrometry sameAs Hmotnostní_spektrometrie_sekundárních_iontů.
- Secondary_ion_mass_spectrometry sameAs Sekundärionen-Massenspektrometrie.
- Secondary_ion_mass_spectrometry sameAs Spectrométrie_de_masse_à_ionisation_secondaire.
- Secondary_ion_mass_spectrometry sameAs Spettrometria_di_massa_di_ioni_secondari.
- Secondary_ion_mass_spectrometry sameAs 二次イオン質量分析法.
- Secondary_ion_mass_spectrometry sameAs ToF-SIMS.
- Secondary_ion_mass_spectrometry sameAs m.02_p5f.
- Secondary_ion_mass_spectrometry sameAs Q556046.
- Secondary_ion_mass_spectrometry sameAs Q556046.
- Secondary_ion_mass_spectrometry sameAs Secondary_ion_mass_spectrometry.
- Secondary_ion_mass_spectrometry wasDerivedFrom Secondary_ion_mass_spectrometry?oldid=597956263.
- Secondary_ion_mass_spectrometry depiction IMS3F_pbmf.JPG.
- Secondary_ion_mass_spectrometry isPrimaryTopicOf Secondary_ion_mass_spectrometry.
