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- Semiconductor_characterization_techniques abstract "The purpose of this article is to summarize the methods used to experimentally characterize a semiconductor material or device (PN junction, Schottky diode, etc.). Some examples of semiconductor quantities that could be characterized include depletion width, carrier concentration, optical generation and recombination rate, carrier lifetimes, defect concentration, trap states, etc.These quantities fall into three categories when it comes to characterization methods:1) Electrical Characterization2) Optical Characterization3) Physical/Chemical Characterization".
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- Semiconductor_characterization_techniques wikiPageRevisionID "603373887".
- Semiconductor_characterization_techniques hasPhotoCollection Semiconductor_characterization_techniques.
- Semiconductor_characterization_techniques subject Category:Semiconductor_analysis.
- Semiconductor_characterization_techniques comment "The purpose of this article is to summarize the methods used to experimentally characterize a semiconductor material or device (PN junction, Schottky diode, etc.).".
- Semiconductor_characterization_techniques label "Semiconductor characterization techniques".
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- Semiconductor_characterization_techniques sameAs Q7449391.
- Semiconductor_characterization_techniques sameAs Q7449391.
- Semiconductor_characterization_techniques wasDerivedFrom Semiconductor_characterization_techniques?oldid=603373887.
- Semiconductor_characterization_techniques isPrimaryTopicOf Semiconductor_characterization_techniques.