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- Sensitive_high-resolution_ion_microprobe abstract "The Sensitive High Resolution Ion Microprobe (SHRIMP) is a large-diameter, double-focusing secondary ion mass spectrometer (SIMS) sector instrument produced by Australian Scientific Instruments in Canberra, Australia. The SHRIMP microprobe focuses a primary beam of ions on a sample sputtering secondary ions which are focussed, filtered and measured according to their energy and mass.The SHRIMP is primarily used for geological and geochemical applications. It can rapidly measure the isotopic and elemental abundances in minerals at a micrometre-scale and is therefore well-suited for the analysis of complex minerals, as often found in metamorphic terrains, some igneous rocks, and for relatively rapid analysis of statistical valid sets of detrital minerals from sedimentary rocks. The most common application of the instrument is in uranium-thorium-lead geochronology, although the SHRIMP can be used to measure other isotopic and elemental abundances.".
- Sensitive_high-resolution_ion_microprobe thumbnail SHRIMP_diagram.svg?width=300.
- Sensitive_high-resolution_ion_microprobe wikiPageExternalLink shrimp.anu.edu.au.
- Sensitive_high-resolution_ion_microprobe wikiPageExternalLink www.asi-pl.com.
- Sensitive_high-resolution_ion_microprobe wikiPageID "1357593".
- Sensitive_high-resolution_ion_microprobe wikiPageRevisionID "604535362".
- Sensitive_high-resolution_ion_microprobe caption "Schematic diagram of a SHRIMP instrument illustrating the ion beam path. After Figure 4, Williams, 1998.".
- Sensitive_high-resolution_ion_microprobe float "float".
- Sensitive_high-resolution_ion_microprobe hasPhotoCollection Sensitive_high-resolution_ion_microprobe.
- Sensitive_high-resolution_ion_microprobe height "350".
- Sensitive_high-resolution_ion_microprobe imageLeft "10".
- Sensitive_high-resolution_ion_microprobe imageTop "10".
- Sensitive_high-resolution_ion_microprobe imageWidth "600".
- Sensitive_high-resolution_ion_microprobe imagemap "Image:SHRIMP diagram.svg".
- Sensitive_high-resolution_ion_microprobe width "620".
- Sensitive_high-resolution_ion_microprobe subject Category:Geochronology.
- Sensitive_high-resolution_ion_microprobe subject Category:Mass_spectrometry.
- Sensitive_high-resolution_ion_microprobe comment "The Sensitive High Resolution Ion Microprobe (SHRIMP) is a large-diameter, double-focusing secondary ion mass spectrometer (SIMS) sector instrument produced by Australian Scientific Instruments in Canberra, Australia. The SHRIMP microprobe focuses a primary beam of ions on a sample sputtering secondary ions which are focussed, filtered and measured according to their energy and mass.The SHRIMP is primarily used for geological and geochemical applications.".
- Sensitive_high-resolution_ion_microprobe label "SHRIMP".
- Sensitive_high-resolution_ion_microprobe label "Sensitive High Resolution Ion Microprobe".
- Sensitive_high-resolution_ion_microprobe label "Sensitive high-resolution ion microprobe".
- Sensitive_high-resolution_ion_microprobe sameAs Sensitive_High_Resolution_Ion_Microprobe.
- Sensitive_high-resolution_ion_microprobe sameAs SHRIMP.
- Sensitive_high-resolution_ion_microprobe sameAs m.04wf_0.
- Sensitive_high-resolution_ion_microprobe sameAs Q906601.
- Sensitive_high-resolution_ion_microprobe sameAs Q906601.
- Sensitive_high-resolution_ion_microprobe wasDerivedFrom Sensitive_high-resolution_ion_microprobe?oldid=604535362.
- Sensitive_high-resolution_ion_microprobe depiction SHRIMP_diagram.svg.
- Sensitive_high-resolution_ion_microprobe isPrimaryTopicOf Sensitive_high-resolution_ion_microprobe.
