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- Standard_Test_Data_Format abstract "Standard Test Data Format (STDF) is a proprietary file format for semiconductor test information originally developed by Teradyne, but it is now a de facto standard widely used throughout the semiconductor industry. It is a commonly used format produced by automatic test equipment (ATE) platforms from companies such as LTX-Credence, Roos Instruments, Teradyne, Advantest, and others. STDF is a binary format, but can be converted either to an ASCII format known as ATDF or to a tab delimited text file. Decoding the STDF variable length binary field data format to extract ASCII text is non-trivial as it involves a detailed comprehension of the STDF specification, the current (2007) version 4 specification being over 100 pages in length. Software tools exist for processing STDF generated files and performing statistical analysis on a population of tested devices.".
- Standard_Test_Data_Format wikiPageExternalLink stdfv4-spec.pdf.
- Standard_Test_Data_Format wikiPageExternalLink pystdf.
- Standard_Test_Data_Format wikiPageExternalLink stdf4j.
- Standard_Test_Data_Format wikiPageExternalLink stdfparser.
- Standard_Test_Data_Format wikiPageExternalLink DOC-15174.
- Standard_Test_Data_Format wikiPageExternalLink spec.pdf.
- Standard_Test_Data_Format wikiPageExternalLink freestdf.sourceforge.net.
- Standard_Test_Data_Format wikiPageExternalLink ttsg.
- Standard_Test_Data_Format wikiPageExternalLink Main_Page.
- Standard_Test_Data_Format wikiPageExternalLink stdf.radar.googlepages.com.
- Standard_Test_Data_Format wikiPageExternalLink CAST.
- Standard_Test_Data_Format wikiPageExternalLink linqtostdf.codeplex.com.
- Standard_Test_Data_Format wikiPageExternalLink standard-test-data-format-stdf.
- Standard_Test_Data_Format wikiPageID "8721680".
- Standard_Test_Data_Format wikiPageRevisionID "596891258".
- Standard_Test_Data_Format hasPhotoCollection Standard_Test_Data_Format.
- Standard_Test_Data_Format subject Category:Computer_file_formats.
- Standard_Test_Data_Format type Abstraction100002137.
- Standard_Test_Data_Format type Communication100033020.
- Standard_Test_Data_Format type ComputerFileFormats.
- Standard_Test_Data_Format type Format106636806.
- Standard_Test_Data_Format type Information106634376.
- Standard_Test_Data_Format type Message106598915.
- Standard_Test_Data_Format comment "Standard Test Data Format (STDF) is a proprietary file format for semiconductor test information originally developed by Teradyne, but it is now a de facto standard widely used throughout the semiconductor industry. It is a commonly used format produced by automatic test equipment (ATE) platforms from companies such as LTX-Credence, Roos Instruments, Teradyne, Advantest, and others.".
- Standard_Test_Data_Format label "Standard Test Data Format".
- Standard_Test_Data_Format label "Standard Test Data Format".
- Standard_Test_Data_Format label "Standard Test Data Format".
- Standard_Test_Data_Format sameAs Standard_Test_Data_Format.
- Standard_Test_Data_Format sameAs Standard_Test_Data_Format.
- Standard_Test_Data_Format sameAs m.027g89l.
- Standard_Test_Data_Format sameAs Q1601835.
- Standard_Test_Data_Format sameAs Q1601835.
- Standard_Test_Data_Format sameAs Standard_Test_Data_Format.
- Standard_Test_Data_Format wasDerivedFrom Standard_Test_Data_Format?oldid=596891258.
- Standard_Test_Data_Format isPrimaryTopicOf Standard_Test_Data_Format.