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- Substrate_mapping abstract "Substrate mapping, also known as 'wafer mapping' is a process in which the performance of semiconductor devices on a substrate is represented by a map showing the performance as a colour-coded grid. The map is a convenient representation of the variation in performance across the substrate, since the distribution of those variations may be a clue as to their cause.The concept also includes the package of data generated by modern wafer testing equipment which can be transmitted to equipment used for subsequent 'back-end' manufacturing operations.".
- Substrate_mapping thumbnail Wafermap.jpg?width=300.
- Substrate_mapping wikiPageExternalLink www.semi.org.
- Substrate_mapping wikiPageExternalLink www.semi.org.
- Substrate_mapping wikiPageID "7264522".
- Substrate_mapping wikiPageRevisionID "539953403".
- Substrate_mapping hasPhotoCollection Substrate_mapping.
- Substrate_mapping subject Category:Semiconductor_device_fabrication.
- Substrate_mapping comment "Substrate mapping, also known as 'wafer mapping' is a process in which the performance of semiconductor devices on a substrate is represented by a map showing the performance as a colour-coded grid.".
- Substrate_mapping label "Substrate mapping".
- Substrate_mapping sameAs m.025xn7w.
- Substrate_mapping sameAs Q7632165.
- Substrate_mapping sameAs Q7632165.
- Substrate_mapping wasDerivedFrom Substrate_mapping?oldid=539953403.
- Substrate_mapping depiction Wafermap.jpg.
- Substrate_mapping isPrimaryTopicOf Substrate_mapping.
