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- catalog accrualPolicy "Quarterly".
- catalog alternative "Design & test of computers".
- catalog alternative "Design and test of computers".
- catalog alternative "IEEE des. test comput.".
- catalog alternative "IEEE design & test of computers (Online) mck".
- catalog alternative "IEEE design & test".
- catalog alternative "IEEE design and test of computers".
- catalog contributor b178178.
- catalog contributor b178179.
- catalog created "[c1984-".
- catalog date "1984".
- catalog date "[c1984-".
- catalog dateCopyrighted "[c1984-".
- catalog extent "v. :".
- catalog hasFormat "Also available to subscribers via the World Wide Web.".
- catalog identifier "0740-7475".
- catalog isFormatOf "Also available to subscribers via the World Wide Web.".
- catalog issued "1984".
- catalog issued "[c1984-".
- catalog language "eng".
- catalog publisher "[Los Alamitos, CA] : IEEE Computer Society,".
- catalog relation "Also available to subscribers via the World Wide Web.".
- catalog subject "Computer engineering Periodicals.".
- catalog subject "Computers Testing Periodicals.".
- catalog title "Design & test of computers".
- catalog title "Design and test of computers".
- catalog title "IEEE des. test comput.".
- catalog title "IEEE design & test of computers microform / IEEE Computer Society [and] the Institute of Electrical and Electronics Engineers, Inc.".
- catalog title "IEEE design & test of computers".
- catalog title "IEEE design & test".
- catalog title "IEEE design and test of computers".
- catalog type "Computer network resources. local".
- catalog type "Electronic journals. lcsh".
- catalog type "text".