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- catalog contributor b234696.
- catalog contributor b234697.
- catalog contributor b234698.
- catalog contributor b234699.
- catalog contributor b234700.
- catalog contributor b234701.
- catalog created "1980.".
- catalog date "1980".
- catalog date "1980.".
- catalog dateCopyrighted "1980.".
- catalog description "Includes bibliographical references.".
- catalog extent "xiv, 665 p. :".
- catalog hasFormat "Eighth International Congress on X-ray Optics and Microanalysis.".
- catalog identifier "0878121803".
- catalog isFormatOf "Eighth International Congress on X-ray Optics and Microanalysis.".
- catalog issued "1980".
- catalog issued "1980.".
- catalog language "eng".
- catalog language "engfre".
- catalog publisher "Midland, Mich. : Pendell Pub. Co.,".
- catalog relation "Eighth International Congress on X-ray Optics and Microanalysis.".
- catalog subject "Electronics, Medical congresses.".
- catalog subject "Microchemistry Congresses.".
- catalog subject "Microchemistry congresses.".
- catalog subject "Microradiography Congresses.".
- catalog subject "Microradiography instrumentation congresses.".
- catalog subject "Probes (Electronic instruments) Congresses.".
- catalog subject "QD79.M5 I57 1977".
- catalog subject "Radiation, Ionizing congresses.".
- catalog subject "X-rays Congresses.".
- catalog title "Eighth International Congress on X-ray Optics and Microanalysis / edited by Donald R. Beaman, Robert E. Ogilvie, and David B. Wittry.".
- catalog type "Conference proceedings. fast".
- catalog type "text".