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- catalog contributor b291757.
- catalog created "1984.".
- catalog date "1984".
- catalog date "1984.".
- catalog dateCopyrighted "1984.".
- catalog description "Includes bibliographies and index.".
- catalog description "Introduction to electron beam instruments -- Electron-specimen interactions -- Layout and operational modes of electron beam instruments -- Interpretation of diffraction information -- Analysis of micrographs in TEM, STEM, HREM, and SEM -- Interpretation of analytical data.".
- catalog extent "vi, 210 p. :".
- catalog hasFormat "Electron beam analysis of materials.".
- catalog identifier "0412233908".
- catalog identifier "0412234009 (pbk.)".
- catalog isFormatOf "Electron beam analysis of materials.".
- catalog issued "1984".
- catalog issued "1984.".
- catalog language "eng".
- catalog publisher "London ; New York : Chapman and Hall,".
- catalog relation "Electron beam analysis of materials.".
- catalog subject "620.1/127 19".
- catalog subject "Electron beams Industrial applications.".
- catalog subject "Electron microscopy.".
- catalog subject "Materials Analysis.".
- catalog subject "TA417.23 .L67 1984".
- catalog tableOfContents "Introduction to electron beam instruments -- Electron-specimen interactions -- Layout and operational modes of electron beam instruments -- Interpretation of diffraction information -- Analysis of micrographs in TEM, STEM, HREM, and SEM -- Interpretation of analytical data.".
- catalog title "Electron beam analysis of materials / M.H. Loretto.".
- catalog type "text".