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- catalog contributor b678661.
- catalog contributor b678662.
- catalog contributor b678663.
- catalog created "c1983.".
- catalog date "1983".
- catalog date "c1983.".
- catalog dateCopyrighted "c1983.".
- catalog description "1. Stem-and-leaf displays / John D. Emerson and David C. Hoaglin -- 2. Letter values: a set of selected order statistics / David C. Hoaglin -- 3. Boxplots and batch comparison / John D. Emerson and Judith Strenio -- 4. Transforming data / John D. Emerson and Michael A. Stoto -- 5. Resistant lines for y versus x / John D. Emerson and David C. Hoaglin -- 6. Analysis of two-way tables by medians / John D. Emerson and David C. Hoaglin -- 7. Examining residuals / Colin Goodall -- 8. Mathematical aspects of transformation / John D. Emerson -- 9. Introduction to more refined estimators / David C. Hoaglin, Frederick Mosteller, and John W. Tukey -- 10. Comparing location estimators: trimmed means, medians, and trimean / James L. Rosenberger and Mariam Gasko -- 11. M-estimators of location: an outline of the theory / Colin Goodall -- 12. Robust scales estimators and confidence intervals for location / Boris Iglewicz.".
- catalog description "Includes bibliographies and index.".
- catalog extent "xvi, 447 p. :".
- catalog hasFormat "Understanding robust and exploratory data analysis.".
- catalog identifier "0471097772 :".
- catalog isFormatOf "Understanding robust and exploratory data analysis.".
- catalog isPartOf "Wiley series in probability and mathematical statistics. Applied probability and statistics, 0271-6356".
- catalog issued "1983".
- catalog issued "c1983.".
- catalog language "eng".
- catalog publisher "New York : Wiley,".
- catalog relation "Understanding robust and exploratory data analysis.".
- catalog subject "Mathematical statistics.".
- catalog subject "Mathematics.".
- catalog subject "QA276 .U5 1983".
- catalog subject "Statistics.".
- catalog tableOfContents "1. Stem-and-leaf displays / John D. Emerson and David C. Hoaglin -- 2. Letter values: a set of selected order statistics / David C. Hoaglin -- 3. Boxplots and batch comparison / John D. Emerson and Judith Strenio -- 4. Transforming data / John D. Emerson and Michael A. Stoto -- 5. Resistant lines for y versus x / John D. Emerson and David C. Hoaglin -- 6. Analysis of two-way tables by medians / John D. Emerson and David C. Hoaglin -- 7. Examining residuals / Colin Goodall -- 8. Mathematical aspects of transformation / John D. Emerson -- 9. Introduction to more refined estimators / David C. Hoaglin, Frederick Mosteller, and John W. Tukey -- 10. Comparing location estimators: trimmed means, medians, and trimean / James L. Rosenberger and Mariam Gasko -- 11. M-estimators of location: an outline of the theory / Colin Goodall -- 12. Robust scales estimators and confidence intervals for location / Boris Iglewicz.".
- catalog title "Understanding robust and exploratory data analysis / edited by David C. Hoaglin, Frederick Mosteller, John W. Tukey.".
- catalog type "text".