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- catalog contributor b688042.
- catalog created "c1978.".
- catalog date "1978".
- catalog date "c1978.".
- catalog dateCopyrighted "c1978.".
- catalog description "Fundamentals -- Properties of x-rays -- Geometry of crystals -- Diffraction I: direction of diffracted beams -- Diffraction II: intensities of diffracted beams -- Experimental methods -- Laue photographs -- Powder photographs -- Diffractometer and spectrometer measurements -- Applications -- Orientation and quality of single crystals -- Structure of polycrystalline aggregates -- Determination of crystal structure -- Precise parameter measurements -- Phase-diagram determination -- Order-disorder transformations -- Chemical analysis by X-ray diffraction -- Chemical analysis by X-ray spectrometry -- Measurement of residual stress.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "xii, 555 p. :".
- catalog hasFormat "Elements of x-ray diffraction.".
- catalog identifier "0201011743".
- catalog isFormatOf "Elements of x-ray diffraction.".
- catalog isPartOf "Addison-Wesley series in metallurgy and materials".
- catalog issued "1978".
- catalog issued "c1978.".
- catalog language "eng".
- catalog publisher "Reading, Mass. : Addison-Wesley Pub. Co.,".
- catalog relation "Elements of x-ray diffraction.".
- catalog subject "543/.085".
- catalog subject "QC482.D5 C84 1978".
- catalog subject "X-rays Diffraction.".
- catalog tableOfContents "Fundamentals -- Properties of x-rays -- Geometry of crystals -- Diffraction I: direction of diffracted beams -- Diffraction II: intensities of diffracted beams -- Experimental methods -- Laue photographs -- Powder photographs -- Diffractometer and spectrometer measurements -- Applications -- Orientation and quality of single crystals -- Structure of polycrystalline aggregates -- Determination of crystal structure -- Precise parameter measurements -- Phase-diagram determination -- Order-disorder transformations -- Chemical analysis by X-ray diffraction -- Chemical analysis by X-ray spectrometry -- Measurement of residual stress.".
- catalog title "Elements of x-ray diffraction / B. D. Cullity.".
- catalog type "text".