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- catalog contributor b1388124.
- catalog created "1980.".
- catalog date "1980".
- catalog date "1980.".
- catalog dateCopyrighted "1980.".
- catalog description "Bibliography: p. 747-774.".
- catalog description "Mental testing under fire -- Tests on trial -- The drive for equality -- The distribution of mental ability -- Varieties of mental test items -- Do IQ tests really measure intelligence? -- Reliability and stability of mental measurements -- Validity and correlates of mental tests -- Definitions and criteria of test bias -- Bias in predictive validity: empirical evidence -- Internal criteria of test bias: empirical evidence -- External sources of bias -- Sex bias -- Culture-reduced tests and techniques -- Uses and abuses of tests.".
- catalog extent "xiii, 786 p. :".
- catalog hasFormat "Bias in mental testing.".
- catalog identifier "0029164303".
- catalog isFormatOf "Bias in mental testing.".
- catalog issued "1980".
- catalog issued "1980.".
- catalog language "eng".
- catalog publisher "New York : Free Press,".
- catalog relation "Bias in mental testing.".
- catalog subject "153.9/3".
- catalog subject "BF 432.A1 J54b 1980".
- catalog subject "BF432.A1 J46".
- catalog subject "Educational tests and measurements.".
- catalog subject "Intelligence Tests".
- catalog subject "Intelligence tests.".
- catalog subject "Minorities Psychological testing.".
- catalog subject "Minority Groups".
- catalog subject "Test bias.".
- catalog tableOfContents "Mental testing under fire -- Tests on trial -- The drive for equality -- The distribution of mental ability -- Varieties of mental test items -- Do IQ tests really measure intelligence? -- Reliability and stability of mental measurements -- Validity and correlates of mental tests -- Definitions and criteria of test bias -- Bias in predictive validity: empirical evidence -- Internal criteria of test bias: empirical evidence -- External sources of bias -- Sex bias -- Culture-reduced tests and techniques -- Uses and abuses of tests.".
- catalog title "Bias in mental testing / Arthur R. Jensen.".
- catalog type "Fehlerkonstanz. swd".
- catalog type "text".