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- catalog contributor b1559283.
- catalog created "c1981.".
- catalog date "1981".
- catalog date "c1981.".
- catalog dateCopyrighted "c1981.".
- catalog description "Includes bibliographical references and indexes.".
- catalog extent "xxiii, 578 p., [4] leaves of plates :".
- catalog hasFormat "Electron beam x-ray microanalysis.".
- catalog identifier "0442232861".
- catalog isFormatOf "Electron beam x-ray microanalysis.".
- catalog issued "1981".
- catalog issued "c1981.".
- catalog language "eng".
- catalog publisher "New York : Van Nostrand Reinhold Co.,".
- catalog relation "Electron beam x-ray microanalysis.".
- catalog subject "Electron probe microanalysis.".
- catalog subject "QD98.E4 H44".
- catalog subject "X-ray spectroscopy.".
- catalog title "Electron beam x-ray microanalysis / Kurt F. J. Heinrich.".
- catalog type "text".