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- catalog contributor b1243251.
- catalog contributor b1243252.
- catalog created "1981-1983.".
- catalog date "1981".
- catalog date "1981-1983.".
- catalog dateCopyrighted "1981-1983.".
- catalog description "1. Theoretical aspects -- 2. Experimental aspects.".
- catalog description "Includes bibliographical references and indexes.".
- catalog extent "2 v. :".
- catalog identifier "0387105182 (U.S. : v. 1)".
- catalog identifier "0387115153 (U.S. : v. 2)".
- catalog isPartOf "Springer series in solid-state sciences ; 22, 35".
- catalog issued "1981".
- catalog issued "1981-1983.".
- catalog language "eng".
- catalog publisher "Berlin ; New York : Springer-Verlag,".
- catalog subject "Point defects.".
- catalog subject "Semiconductors Defects.".
- catalog tableOfContents "1. Theoretical aspects -- 2. Experimental aspects.".
- catalog title "Point defects in semiconductors / M. Lannoo, J. Bourgoin.".
- catalog type "text".