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- catalog alternative "Anomalous (resonance) X-ray scattering for structural characterization of disordered materials.".
- catalog contributor b1622142.
- catalog created "1984.".
- catalog date "1984".
- catalog date "1984.".
- catalog dateCopyrighted "1984.".
- catalog description "Bibliography: p. [170]-177.".
- catalog extent "vi, 183 p. :".
- catalog identifier "0387133593 (U.S.)".
- catalog identifier "3540133593 (West Germany)".
- catalog isPartOf "Lecture notes in physics ; 204".
- catalog issued "1984".
- catalog issued "1984.".
- catalog language "eng".
- catalog publisher "Berlin ; New York : Springer-Verlag,".
- catalog subject "Crystallography.".
- catalog subject "Order-disorder models.".
- catalog subject "Physics.".
- catalog subject "X-rays Scattering.".
- catalog title "Anomalous (resonance) X-ray scattering for structural characterization of disordered materials.".
- catalog title "Novel application of anomalous (resonance) X-ray scattering for structural characterization of disordered materials / Yoshio Waseda.".
- catalog type "text".