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- catalog alternative "X-ray microanalysis in the electron microscope".
- catalog contributor b1744540.
- catalog contributor b1744541.
- catalog contributor b1744542.
- catalog created "1977.".
- catalog date "1977".
- catalog date "1977.".
- catalog dateCopyrighted "1977.".
- catalog description "Includes bibliographies and index.".
- catalog description "X-ray microanalysis in the electronic microscope / Chandler, John A.".
- catalog extent "xv, 311 p. :".
- catalog hasFormat "Staining methods for sectioned material.".
- catalog identifier "0720406064".
- catalog identifier "0720442508 (North-Holland set)".
- catalog isFormatOf "Staining methods for sectioned material.".
- catalog isPartOf "Practical methods in electron microscopy ; v. 5, pt. 1".
- catalog issued "1977".
- catalog issued "1977.".
- catalog language "eng".
- catalog publisher "Amsterdam ; New York : North-Holland ; New York : Sole distributors for the U.S.A. and Canada, Elsevier/North-Holland,".
- catalog relation "Staining methods for sectioned material.".
- catalog subject "QH 237 L675s 1977".
- catalog subject "QH207 .P7 v.5".
- catalog subject "Stains and Staining methods.".
- catalog subject "Stains and staining (Microscopy)".
- catalog subject "X-Ray Diffraction.".
- catalog subject "X-rays Diffraction.".
- catalog tableOfContents "X-ray microanalysis in the electronic microscope / Chandler, John A.".
- catalog title "Staining methods for sectioned material / P.R. Lewis, D.P. Knight.".
- catalog title "X-ray microanalysis in the electron microscope".
- catalog type "text".