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- catalog contributor b1869471.
- catalog contributor b1869472.
- catalog contributor b1869473.
- catalog contributor b1869474.
- catalog contributor b1869475.
- catalog contributor b1869476.
- catalog created "c1987.".
- catalog date "1987".
- catalog date "c1987.".
- catalog dateCopyrighted "c1987.".
- catalog description "Includes bibliographies and indexes.".
- catalog extent "xv, 532 p. :".
- catalog hasFormat "Characterization of defects in materials.".
- catalog identifier "0931837472".
- catalog isFormatOf "Characterization of defects in materials.".
- catalog isPartOf "Materials Research Society symposia proceedings ; v. 82".
- catalog issued "1987".
- catalog issued "c1987.".
- catalog language "eng".
- catalog publisher "Pittsburgh, Pa. : Materials Research Society,".
- catalog relation "Characterization of defects in materials.".
- catalog subject "620.1/12 19".
- catalog subject "Crystals Defects Congresses.".
- catalog subject "Materials Defects Congresses.".
- catalog subject "TA418.5 .C48 1987".
- catalog title "Characterization of defects in materials : symposium held December 1-2, 1986, Boston, Massachusetts, USA / editors, Richard W. Siegel, Julia R. Weertman, Robert Sinclair.".
- catalog type "Boston (Mass., 1986) swd".
- catalog type "Conference proceedings. fast".
- catalog type "text".