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- catalog contributor b2140689.
- catalog contributor b2140690.
- catalog contributor b2140691.
- catalog contributor b2140692.
- catalog contributor b2140693.
- catalog created "[1975]".
- catalog date "1975".
- catalog date "[1975]".
- catalog dateCopyrighted "[1975]".
- catalog description "Includes bibliographical references and index.".
- catalog extent "xiii, 474 p. :".
- catalog hasFormat "Physical aspects of electron microscopy and microbeam analysis.".
- catalog identifier "0471790206".
- catalog isFormatOf "Physical aspects of electron microscopy and microbeam analysis.".
- catalog isPartOf "A Wiley biomedical-health publication".
- catalog issued "1975".
- catalog issued "[1975]".
- catalog language "eng".
- catalog publisher "New York : Wiley,".
- catalog relation "Physical aspects of electron microscopy and microbeam analysis.".
- catalog subject "535/.3325".
- catalog subject "Electron Probe Microanalysis".
- catalog subject "Electron microscopy.".
- catalog subject "Microchemistry.".
- catalog subject "Microprobe analysis.".
- catalog subject "Microscopy, Electron".
- catalog subject "QH 212 P578 1973".
- catalog subject "QH212.E4 S53 1975".
- catalog title "Physical aspects of electron microscopy and microbeam analysis / edited by Benjamin M. Siegel and D. R. Beaman.".
- catalog type "text".