Matches in Harvard for { <http://id.lib.harvard.edu/aleph/001597159/catalog> ?p ?o. }
Showing items 1 to 27 of
27
with 100 items per page.
- catalog contributor b2278914.
- catalog contributor b2278915.
- catalog contributor b2278916.
- catalog contributor b2278917.
- catalog created "c1985.".
- catalog date "1985".
- catalog date "c1985.".
- catalog dateCopyrighted "c1985.".
- catalog description "Includes bibliographies and indexes.".
- catalog extent "xv, 604 p. :".
- catalog hasFormat "Microscopic identification of electronic defects in semiconductors.".
- catalog identifier "0931837111 :".
- catalog isFormatOf "Microscopic identification of electronic defects in semiconductors.".
- catalog isPartOf "Materials Research Society symposia proceedings, 0272-9172 ; v. 46".
- catalog issued "1985".
- catalog issued "c1985.".
- catalog language "eng".
- catalog publisher "Pittsburgh, Pa. : Materials Research Society,".
- catalog relation "Microscopic identification of electronic defects in semiconductors.".
- catalog subject "621.3815/2 19".
- catalog subject "Microscopes Congresses.".
- catalog subject "Microscopy Congresses.".
- catalog subject "Semiconductors Defects Congresses.".
- catalog subject "Semiconductors Microscopy Congresses.".
- catalog subject "TK7871.85 .M53 1985".
- catalog title "Microscopic identification of electronic defects in semiconductors : symposium held April 15-18, 1985, San Francisco, California, U.S.A. / editors, Noble M. Johnson, Stephen G. Bishop, George D. Watkins.".
- catalog type "text".