Data Portal @ linkeddatafragments.org

Matches in Harvard for { <http://id.lib.harvard.edu/aleph/001611329/catalog> ?p ?o. }

• catalog contributor b2301794.
• catalog contributor b2301795.
• catalog contributor b2301796.
• catalog created "[1960]".
• catalog date "1960".
• catalog date "[1960]".
• catalog dateCopyrighted "[1960]".
• catalog description "Part One: Essential features of the Stanford revisions -- 1. The first revision, 1916 -- 2. The second revision, 1937 : The 1937 revision a Binet type test ; Item selection ; Selection of subjects ; Reliability and validity -- 3. The third revision, 1960 : Preliminary considerations ; Criteria for the selection of items ; Locating items in the scale ; Factors affecting IQ variability ; IQ variability in relation to age ; Correlations between retests ; A frame of reference for classifying IQs ; Problems involved in test revision ; Essential features of the 1960 scale ; Sources of material for scale revision ; Determining the difficulty of items ; Procedures employed in the analysis of test records ; Clarification of scoring principles and test administration ; Changes in the 1960 scale ; Content ; Structural changes ; Revised IQ tables ; Shifts in item difficulty ; Characteristics of curves showing percents passing ; Validity and reliability ; Abilities sampled by the scales ; Factor analyses of Stanford-Binet test items ; Stratified samples at ages 6 and 15 ; The two-and-a-half-year-old sample ; Summary".
• catalog description "Part Three: Revised intelligence quotient tables : Pinneau revised IQ tables ; Appendix A: Conversion tables ; Appendix B: Tests of the L-M scale in 1937 and 1960.".
• catalog description "Part Two: Guide for administering and scoring -- Form L-M -- Testing Procedure -- General directions : Adherence to standard procedure ; Working within a frame ; Order of giving the tests ; General principles of procedure ; When may a question be repeated? ; Ambiguous responses ; The importance of rapport ; The testing of preschool children ; The appraisal of responses ; Mastery of the scoring rules ; Avoidance of the "halo" effect ; Scoring not purely mechanical ; Administering the tests ; The surroundings ; The presence of others ; Manipulating the test material ; Duration of examination ; To maintain standard conditions of testing ; Where to begin testing ; Scattering of successes ; Determining the basal age and ceiling (maximal) level ; Abbreviated tests ; Alternative tests ; Computation of MA scores ; Finding the IQ -- Specific instructions for administering Form L-M -- Scoring standards for Form L-M".
• catalog extent "363 p.".
• catalog hasFormat "Stanford-Binet intelligence scale.".
• catalog isFormatOf "Stanford-Binet intelligence scale.".
• catalog isPartOf "Houghton Mifflin Company tests".
• catalog issued "1960".
• catalog issued "[1960]".
• catalog language "eng".
• catalog publisher "Boston, Houghton Mifflin".
• catalog relation "Stanford-Binet intelligence scale.".
• catalog subject "151.222".
• catalog subject "LB1131 .T53".
• catalog subject "Stanford-Binet Test.".
• catalog tableOfContents "Part One: Essential features of the Stanford revisions -- 1. The first revision, 1916 -- 2. The second revision, 1937 : The 1937 revision a Binet type test ; Item selection ; Selection of subjects ; Reliability and validity -- 3. The third revision, 1960 : Preliminary considerations ; Criteria for the selection of items ; Locating items in the scale ; Factors affecting IQ variability ; IQ variability in relation to age ; Correlations between retests ; A frame of reference for classifying IQs ; Problems involved in test revision ; Essential features of the 1960 scale ; Sources of material for scale revision ; Determining the difficulty of items ; Procedures employed in the analysis of test records ; Clarification of scoring principles and test administration ; Changes in the 1960 scale ; Content ; Structural changes ; Revised IQ tables ; Shifts in item difficulty ; Characteristics of curves showing percents passing ; Validity and reliability ; Abilities sampled by the scales ; Factor analyses of Stanford-Binet test items ; Stratified samples at ages 6 and 15 ; The two-and-a-half-year-old sample ; Summary".
• catalog tableOfContents "Part Three: Revised intelligence quotient tables : Pinneau revised IQ tables ; Appendix A: Conversion tables ; Appendix B: Tests of the L-M scale in 1937 and 1960.".
• catalog tableOfContents "Part Two: Guide for administering and scoring -- Form L-M -- Testing Procedure -- General directions : Adherence to standard procedure ; Working within a frame ; Order of giving the tests ; General principles of procedure ; When may a question be repeated? ; Ambiguous responses ; The importance of rapport ; The testing of preschool children ; The appraisal of responses ; Mastery of the scoring rules ; Avoidance of the "halo" effect ; Scoring not purely mechanical ; Administering the tests ; The surroundings ; The presence of others ; Manipulating the test material ; Duration of examination ; To maintain standard conditions of testing ; Where to begin testing ; Scattering of successes ; Determining the basal age and ceiling (maximal) level ; Abbreviated tests ; Alternative tests ; Computation of MA scores ; Finding the IQ -- Specific instructions for administering Form L-M -- Scoring standards for Form L-M".
• catalog title "Stanford-Binet intelligence scale; manual for the third revision form L-M [by] Lewis M. Terman [and] Maud A. Merrill. With revised IQ tables by Samuel R. Pinneau.".
• catalog type "text".