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- catalog contributor b2838187.
- catalog contributor b2838188.
- catalog contributor b2838189.
- catalog created "c1989.".
- catalog date "1989".
- catalog date "c1989.".
- catalog dateCopyrighted "c1989.".
- catalog description "Bibliography: p. 275-292.".
- catalog extent "vii, 299 p. :".
- catalog hasFormat "Atom-probe field ion microscopy and its applications.".
- catalog identifier "0120145820".
- catalog isFormatOf "Atom-probe field ion microscopy and its applications.".
- catalog isPartOf "Advances in electronics and electron physics. Supplement ; 20".
- catalog issued "1989".
- catalog issued "c1989.".
- catalog language "eng".
- catalog publisher "Boston : Academic Press, Inc.,".
- catalog relation "Atom-probe field ion microscopy and its applications.".
- catalog subject "Atom-probe field ion microscopy.".
- catalog subject "Field ion microscopes.".
- catalog subject "Microscopes.".
- catalog subject "Microscopy.".
- catalog subject "QH212.A76 S25 1989".
- catalog subject "Surface chemistry.".
- catalog subject "TK7800 .A37 Suppl.20".
- catalog title "Atom-probe field ion microscopy and its applications / Toshio Sakurai, A. Sakai, H.W. Pickering.".
- catalog type "text".