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- catalog contributor b3172111.
- catalog contributor b3172112.
- catalog contributor b3172113.
- catalog contributor b3172114.
- catalog created "1991.".
- catalog date "1991".
- catalog date "1991.".
- catalog dateCopyrighted "1991.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "xiii, 367 p. :".
- catalog hasFormat "Advances in surface and thin film diffraction.".
- catalog identifier "155899100X".
- catalog isFormatOf "Advances in surface and thin film diffraction.".
- catalog isPartOf "Materials Research Society symposia proceedings ; v. 208.".
- catalog isPartOf "Materials Research Society symposium proceedings, 0272-9172 ; v. 208".
- catalog issued "1991".
- catalog issued "1991.".
- catalog language "eng".
- catalog publisher "Pittsburgh, Pa. : Materials Research Society,".
- catalog relation "Advances in surface and thin film diffraction.".
- catalog subject "620/.44 20".
- catalog subject "Diffraction Congresses.".
- catalog subject "QC176.84.S93 A38 1991".
- catalog subject "Thin films Optical properties Congresses.".
- catalog subject "Thin films Surfaces Congresses.".
- catalog title "Advances in surface and thin film diffraction : symposium held November 27-29, 1990, Boston, Massachusetts, U.S.A. / editors, Ting C. Huang, Philip I. Cohen, David J. Eaglesham.".
- catalog type "Boston (Mass., 1990) swd".
- catalog type "Conference proceedings. fast".
- catalog type "text".