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- catalog contributor b3526010.
- catalog contributor b3526011.
- catalog created "[1962]".
- catalog date "1962".
- catalog date "[1962]".
- catalog dateCopyrighted "[1962]".
- catalog description "Includes bibliographies.".
- catalog extent "v, 207 p.".
- catalog hasFormat "Symposium on Advances in Electron Metallography and Electron Probe Microanalysis.".
- catalog isFormatOf "Symposium on Advances in Electron Metallography and Electron Probe Microanalysis.".
- catalog isPartOf "ASTM special technical publication ; no. 317".
- catalog isPartOf "American Society for Testing and Materials. Special technical publication ; no. 317.".
- catalog issued "1962".
- catalog issued "[1962]".
- catalog language "eng".
- catalog publisher "Philadelphia, American Society for Testing and Materials".
- catalog relation "Symposium on Advances in Electron Metallography and Electron Probe Microanalysis.".
- catalog subject "669.95082".
- catalog subject "Electron microscopes.".
- catalog subject "Metallography.".
- catalog subject "Metallurgy".
- catalog subject "Microscopy, Electron.".
- catalog subject "TN690 .S89 1961".
- catalog title "Symposium on Advances in Electron Metallography and Electron Probe Microanalysis. Sponsored by Subcommittee XI on Electron Microstructure of ASTM Committee E-4 on Electron Metallography, held at Atlantic City, N.J., June 28, 1960, and June 26, 1961.".
- catalog type "Congresses".
- catalog type "text".