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- catalog contributor b3794575.
- catalog contributor b3794576.
- catalog contributor b3794577.
- catalog created "1991.".
- catalog date "1991".
- catalog date "1991.".
- catalog dateCopyrighted "1991.".
- catalog description "Imaging by light optical microscopy / G.F. Vander Voort -- Scanning electron microscopy / D.C. Joy and J.I. Goldstein -- Analytical imaging with a scanning ion microprobe / R. Levi-Setti [and others] -- Acoustic microscopy / G.A.D. Briggs and M. Hoppe -- Transmission electron microscopy / G. Thomas -- Electron diffraction images / D.B. Williams and K.S. Vecchio -- Atomic-resolution microscopy / R. Gronsky -- Surface imaging by scanning tunneling microscopy / S. Chiang and R.J. Wilson -- Atom probe field-ion microscopy : imaging at the atomic level / M.K. Miller and M.G. Burke -- Compositional mapping of the microstructure of materials / D.E. Newbury [and others] -- Processing images and selecting regions of interest / D.S. Bright [and others] -- Image analysis of the microstructure of materials / J.C. Russ.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "xiv, 379 p., [32] p. of plates :".
- catalog hasFormat "Images of materials.".
- catalog identifier "0195058569 :".
- catalog isFormatOf "Images of materials.".
- catalog issued "1991".
- catalog issued "1991.".
- catalog language "eng".
- catalog publisher "New York : Oxford University Press,".
- catalog relation "Images of materials.".
- catalog subject "620.1/127 20".
- catalog subject "Materials Microscopy.".
- catalog subject "TA418.7 .I44 1991".
- catalog tableOfContents "Imaging by light optical microscopy / G.F. Vander Voort -- Scanning electron microscopy / D.C. Joy and J.I. Goldstein -- Analytical imaging with a scanning ion microprobe / R. Levi-Setti [and others] -- Acoustic microscopy / G.A.D. Briggs and M. Hoppe -- Transmission electron microscopy / G. Thomas -- Electron diffraction images / D.B. Williams and K.S. Vecchio -- Atomic-resolution microscopy / R. Gronsky -- Surface imaging by scanning tunneling microscopy / S. Chiang and R.J. Wilson -- Atom probe field-ion microscopy : imaging at the atomic level / M.K. Miller and M.G. Burke -- Compositional mapping of the microstructure of materials / D.E. Newbury [and others] -- Processing images and selecting regions of interest / D.S. Bright [and others] -- Image analysis of the microstructure of materials / J.C. Russ.".
- catalog title "Images of materials / edited by David B. Williams, Alan R. Pelton, Ronald Gronsky ; with a foreword by Peter B. Hirsch.".
- catalog type "text".