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- catalog contributor b3839149.
- catalog contributor b3839150.
- catalog contributor b3839151.
- catalog contributor b3839152.
- catalog contributor b3839153.
- catalog created "c1991.".
- catalog date "1991".
- catalog date "c1991.".
- catalog dateCopyrighted "c1991.".
- catalog description "Includes bibliogrpahical references and index.".
- catalog extent "xiii, 358 p. :".
- catalog identifier "1558991190".
- catalog isPartOf "Materials Research Society symposia proceedings ; v. 225.".
- catalog isPartOf "Materials Research Society symposium proceedings ; v. 225".
- catalog issued "1991".
- catalog issued "c1991.".
- catalog language "eng".
- catalog publisher "Pittsburgh, Pa. : Materials Research Society,".
- catalog subject "621.381 20".
- catalog subject "Electrodiffusion Congresses.".
- catalog subject "Microelectronics Materials Testing Congresses.".
- catalog subject "Microelectronics Reliability Congresses.".
- catalog subject "Microstructure Congresses.".
- catalog subject "TK7874 .M3443 1991".
- catalog title "Materials reliability issues in microelectronics : symposium held April 30-May 3, 1991, Anaheim, California, U.S.A. / editors, James R. Lloyd, Frederick G. Yost, Paul S. Ho.".
- catalog type "text".