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- catalog contributor b3933801.
- catalog contributor b3933802.
- catalog created "c1992.".
- catalog date "1992".
- catalog date "c1992.".
- catalog dateCopyrighted "c1992.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "ix, 328 p. :".
- catalog identifier "1558991603".
- catalog isPartOf "Materials Research Society symposia proceedings ; v. 265.".
- catalog isPartOf "Materials Research Society symposium proceedings, 0272-9172 ; v. 265".
- catalog issued "1992".
- catalog issued "c1992.".
- catalog language "eng".
- catalog publisher "Pittsburgh, Penn. : Materials Research Society,".
- catalog subject "621.381 20".
- catalog subject "Electrodiffusion Congresses.".
- catalog subject "Microelectronics Materials Testing Congresses.".
- catalog subject "Microelectronics Reliability Congresses.".
- catalog subject "Microstructure Congresses.".
- catalog subject "TK7874 .M3442 1992".
- catalog title "Materials reliability in microelectronics II : symposium held April 27-May 1, 1992, San Francisco, California, U.S.A. / editors, C.V. Thompson, J.R. Lloyd.".
- catalog type "text".