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catalog contributor b4412426.
catalog contributor b4412427.
catalog contributor b4412428.
catalog created "c1992.".
catalog date "1992".
catalog date "c1992.".
catalog dateCopyrighted "c1992.".
catalog description "Application of ultramicrotomy to TEM specimen preparation of particulate inclusion and composite materials / O.O. Popoola [and others] -- Shaping particles for ultramicrotomy / C.R. Bradley, N.L. Dietz, and J.K. Bates.".
catalog description "Includes bibliographical references and indexes.".
catalog description "Preparation of large thin area VLSI TEM specimens by dimpling with a "flatting tool" / H.L. Humiston, B.M. Tracy, and L.A. Dass -- The syntheses of nanoscale metal particles produced by the beam induced decomposition of metal hydrides and azides in a transmission electron microscope / P.J. Herley, N.P. Fitzsimons, and W. Jones -- Rapid plan view fabrication of semiconductor TEM samples for interface strain and grain size analysis / M.W. Cole and J.R. Flemish -- Precision TEM sample preparation using focused ion beam marking strategies / C.E. Sanborn and S.A. Myers -- Reduced amorphization of ion-milled silicon cross-section transmission electron microscope samples by dynamic annealing during milling / D. Bahnck and R. Hull -- Thickness variations and surface layers in ultramicrotomed sections and their effects on elemental mapping / T. Malis and D. Steele --".
catalog description "R. Anderson and J. Benedict -- Preparation of planview TEM samples of YBa₂Cu₃O--[subscript x] films grown on BaF₂(001) / L. Yang [and others] -- Minimization of non-uniform ion-thinning effects in thin film transverse specimens for transmission electron microscopy / F. Shaapur and K.A. Watson -- Preparation of cross-sectional TEM samples of Fe-Zn couples / L.A. Giannuzzi [and others] -- A high resolution TEM specimen thinning system / R. Clampitt [and others] -- Preparation of microindentations in cross-section / J.C. Morris, G.M. Pharr and D.L. Callahan -- TEM specimen preparation of TiAl alloy powders produced by plasma rotating electrode process / M. Nishida [and others] -- Advanced preparation of hard materials for cross-sectional TEM analysis / K. Ostreicher and C. Sung -- Preparation of large area cross-sectional TEM specimen of semiconducting heteroepitaxial materials / M. Tamura and S. Aoki --".
catalog description "Topographic kinetics and practice of low angle ion beam thinning / Arpad Barna -- FIBXTEM : focussed ion beam milling for TEM sample preparation / David P. Basile [and others] -- Precision ion polishing system / R. Alani and P.R. Swann -- An updated gas source focused ion beam instrument for TEM specimen preparation / R. Alani, J.S. Jones, and P.R. Swann -- Advances in ultrasonic disk cutting and precision dimpling / P.E. Fischione [and others] -- Advancements in dimpling technique for automatically and repeatably thinning TEM samples to near electron transparency / V.L. Carlino and A. Hidalgo -- TEM samples of semiconductors prepared by a small-angle cleavage technique / J.P. McCaffrey -- Recent developments in the use of the tripod polisher for TEM specimen preparation / J.P. Benedict, R. Anderson, and S.J. Klepeis -- Precision ion milling of layered, multi-element TEM specimens with high specimen preparation spatial resolution /".
catalog extent "xi, 288 p. :".
catalog hasFormat "Specimen preparation for transmission electron microscopy of materials III.".
catalog identifier "1558991484".
catalog isFormatOf "Specimen preparation for transmission electron microscopy of materials III.".
catalog isPartOf "Materials Research Society symposia proceedings ; v. 254.".
catalog isPartOf "Materials Research Society symposium proceedings, 0272-9172 ; v. 254".
catalog issued "1992".
catalog issued "c1992.".
catalog language "eng".
catalog publisher "Pittsburgh : Materials Research Society,".
catalog relation "Specimen preparation for transmission electron microscopy of materials III.".
catalog subject "502/.8/25 20".
catalog subject "Electron microscopy Congresses.".
catalog subject "Materials Microscopy Congresses.".
catalog subject "TA417.23 .S632 1992".
catalog tableOfContents "Application of ultramicrotomy to TEM specimen preparation of particulate inclusion and composite materials / O.O. Popoola [and others] -- Shaping particles for ultramicrotomy / C.R. Bradley, N.L. Dietz, and J.K. Bates.".
catalog tableOfContents "Preparation of large thin area VLSI TEM specimens by dimpling with a "flatting tool" / H.L. Humiston, B.M. Tracy, and L.A. Dass -- The syntheses of nanoscale metal particles produced by the beam induced decomposition of metal hydrides and azides in a transmission electron microscope / P.J. Herley, N.P. Fitzsimons, and W. Jones -- Rapid plan view fabrication of semiconductor TEM samples for interface strain and grain size analysis / M.W. Cole and J.R. Flemish -- Precision TEM sample preparation using focused ion beam marking strategies / C.E. Sanborn and S.A. Myers -- Reduced amorphization of ion-milled silicon cross-section transmission electron microscope samples by dynamic annealing during milling / D. Bahnck and R. Hull -- Thickness variations and surface layers in ultramicrotomed sections and their effects on elemental mapping / T. Malis and D. Steele --".
catalog tableOfContents "R. Anderson and J. Benedict -- Preparation of planview TEM samples of YBa₂Cu₃O--[subscript x] films grown on BaF₂(001) / L. Yang [and others] -- Minimization of non-uniform ion-thinning effects in thin film transverse specimens for transmission electron microscopy / F. Shaapur and K.A. Watson -- Preparation of cross-sectional TEM samples of Fe-Zn couples / L.A. Giannuzzi [and others] -- A high resolution TEM specimen thinning system / R. Clampitt [and others] -- Preparation of microindentations in cross-section / J.C. Morris, G.M. Pharr and D.L. Callahan -- TEM specimen preparation of TiAl alloy powders produced by plasma rotating electrode process / M. Nishida [and others] -- Advanced preparation of hard materials for cross-sectional TEM analysis / K. Ostreicher and C. Sung -- Preparation of large area cross-sectional TEM specimen of semiconducting heteroepitaxial materials / M. Tamura and S. Aoki --".
catalog tableOfContents "Topographic kinetics and practice of low angle ion beam thinning / Arpad Barna -- FIBXTEM : focussed ion beam milling for TEM sample preparation / David P. Basile [and others] -- Precision ion polishing system / R. Alani and P.R. Swann -- An updated gas source focused ion beam instrument for TEM specimen preparation / R. Alani, J.S. Jones, and P.R. Swann -- Advances in ultrasonic disk cutting and precision dimpling / P.E. Fischione [and others] -- Advancements in dimpling technique for automatically and repeatably thinning TEM samples to near electron transparency / V.L. Carlino and A. Hidalgo -- TEM samples of semiconductors prepared by a small-angle cleavage technique / J.P. McCaffrey -- Recent developments in the use of the tripod polisher for TEM specimen preparation / J.P. Benedict, R. Anderson, and S.J. Klepeis -- Precision ion milling of layered, multi-element TEM specimens with high specimen preparation spatial resolution /".
catalog title "Specimen preparation for transmission electron microscopy of materials III : symposium held December 5-6, 1991, Boston, Mass., U.S.A. / editors, Ron Anderson, Bryan Tracy, John Bravman.".
catalog type "Conference proceedings. fast".
catalog type "text".