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- catalog contributor b4509088.
- catalog contributor b4509089.
- catalog contributor b4509090.
- catalog created "[1964]".
- catalog date "1964".
- catalog date "[1964]".
- catalog dateCopyrighted "[1964]".
- catalog description "Includes bibliographies.".
- catalog extent "vi, 209 p.".
- catalog isPartOf "ASTM special technical publication ; no. 349".
- catalog isPartOf "American Society for Testing and Materials. Special technical publication ; no. 349.".
- catalog issued "1964".
- catalog issued "[1964]".
- catalog language "eng".
- catalog publisher "Philadelphia, American Society for Testing and Materials".
- catalog subject "544.6".
- catalog subject "Probes (Electronic instruments) Congresses.".
- catalog subject "QD95 .S95 1963".
- catalog subject "X-ray spectroscopy Congresses.".
- catalog title "Symposium on X-Ray and Electron Probe Analysis; [papers] presented at the sixty-sixth annual meeting, American Society for Testing and Materials, Atlantic City, N.J., June 27, 1963.".
- catalog type "text".