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- catalog contributor b6523719.
- catalog contributor b6523720.
- catalog contributor b6523721.
- catalog created "c1975.".
- catalog date "1975".
- catalog date "c1975.".
- catalog dateCopyrighted "c1975.".
- catalog description "Bibliography: p. 131.".
- catalog extent "ix, 134 p. :".
- catalog hasFormat "Defect analysis in electron microscopy.".
- catalog identifier "04121376070412137704".
- catalog identifier "047054760X".
- catalog isFormatOf "Defect analysis in electron microscopy.".
- catalog issued "1975".
- catalog issued "c1975.".
- catalog language "eng".
- catalog publisher "London : Chapman and Hall ; New York : Wiley : distributed by Halstead Press,".
- catalog relation "Defect analysis in electron microscopy.".
- catalog subject "548/.84".
- catalog subject "Crystals Defects.".
- catalog subject "Electron microscopy.".
- catalog subject "QD921 .L67".
- catalog title "Defect analysis in electron microscopy / M. H. Loretto and R. E. Smallman.".
- catalog type "text".