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- catalog contributor b7186048.
- catalog contributor b7186049.
- catalog contributor b7186050.
- catalog created "c1994.".
- catalog date "1994".
- catalog date "c1994.".
- catalog dateCopyrighted "c1994.".
- catalog description "Includes bibliographical references and indexes.".
- catalog extent "xiv, 622 p. :".
- catalog identifier "1558992316".
- catalog isPartOf "Materials Research Society symposia proceedings ; v. 332.".
- catalog isPartOf "Materials Research Society symposium proceedings, 0272-9172 ; v. 332".
- catalog issued "1994".
- catalog issued "c1994.".
- catalog language "eng".
- catalog publisher "Pittsburgh, Pa. : Materials Research Society,".
- catalog subject "620.1/1299/0287 20".
- catalog subject "Microscopy Technique Congresses.".
- catalog subject "Nanostructures Analysis Congresses.".
- catalog subject "Q176.8.N35 D48 1994".
- catalog subject "Spectrum analysis Congresses.".
- catalog title "Determining nanoscale physical properties of materials by microscopy and spectroscopy : symposium held November 29-December 3, 1993, Boston, Massachusetts, U.S.A. / editors, Mehmet Sarikaya, H. Kumar Wickramasinghe, Michael Isaacson.".
- catalog type "text".