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- catalog contributor b8694196.
- catalog created "c1995.".
- catalog date "1995".
- catalog date "c1995.".
- catalog dateCopyrighted "c1995.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "xv, 523 p. :".
- catalog hasFormat "Materials reliability in microelectronics V.".
- catalog identifier "1558992383".
- catalog identifier "1558992944".
- catalog isFormatOf "Materials reliability in microelectronics V.".
- catalog isPartOf "Materials Research Society symposia proceedings ; v. 391.".
- catalog isPartOf "Materials Research Society symposium proceedings, 0272-9172 ; v. 391".
- catalog issued "1995".
- catalog issued "c1995.".
- catalog language "eng".
- catalog publisher "Pittsburgh, Penn. : Materials Research Society,".
- catalog relation "Materials reliability in microelectronics V.".
- catalog subject "Metallizing Congresses.".
- catalog subject "Microelectronics Materials Testing Congresses.".
- catalog subject "Microelectronics Reliability Congresses.".
- catalog subject "Microstructure Congresses.".
- catalog subject "TK7874 .M3442 1995".
- catalog title "Materials reliability in microelectronics V : symposium held April 17-21, 1995, San Francisco, California, U.S.A. / editors, Anthony S. Oates ... [et al.].".
- catalog type "Conference proceedings. fast".
- catalog type "San Francisco (Calif., 1995) swd".
- catalog type "text".