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- catalog alternative "Thin films.".
- catalog contributor b9734490.
- catalog contributor b9734491.
- catalog contributor b9734492.
- catalog contributor b9734493.
- catalog contributor b9734494.
- catalog contributor b9734495.
- catalog contributor b9734496.
- catalog created "1964.".
- catalog date "1964".
- catalog date "1964.".
- catalog dateCopyrighted "1964.".
- catalog description "Includes bibliographical references.".
- catalog extent "vi, 359p.".
- catalog hasFormat "Ellipsometry in the measurement of surfaces and thin films.".
- catalog isFormatOf "Ellipsometry in the measurement of surfaces and thin films.".
- catalog isPartOf "National Bureau of Standards miscellaneous publication ; 256.".
- catalog isPartOf "United States. National Bureau of Standards. Miscellaneous publication ; 256".
- catalog issued "1964".
- catalog issued "1964.".
- catalog language "eng".
- catalog publisher "Washington, U.S. National Bureau of Standards,".
- catalog relation "Ellipsometry in the measurement of surfaces and thin films.".
- catalog subject "535.5".
- catalog subject "Polarization (Light)".
- catalog subject "QC100 .U57 no. 256".
- catalog subject "Surfaces (Technology)".
- catalog subject "Thin films.".
- catalog title "Ellipsometry in the measurement of surfaces and thin films; symposium proceedings.".
- catalog title "Thin films.".
- catalog type "text".