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- catalog contributor b9745451.
- catalog contributor b9745452.
- catalog contributor b9745453.
- catalog contributor b9745454.
- catalog created "1969.".
- catalog date "1969".
- catalog date "1969.".
- catalog dateCopyrighted "1969.".
- catalog description "Includes bibliographies.".
- catalog description "Nondestructive optical techniques for thin-film thickness measurements / by W.A. Pliskin -- A review of x-ray methods for investigating thin films and platings / by Eugene P. Bertin -- X-ray fluorescence and electron microprobe techniques for determination of thin-film thickness / by James E. Cline -- Density determination of sputtered tantalum films by a beta-backscatter technique / by Richard Brown -- The characterization of solid thin films and surfaces by electron microscopy and diffraction / by R.B. Marcus -- The emission-spectrographic and atomic-absorption analyses of metallic thin films / by J.D. Nohe -- RF spark source mass spectrometry for the analysis of surface films / by D.L. Malm -- Chemical and structural evaluation of thin glass films / by W.A. Pliskin.".
- catalog extent "xi, 194 p.".
- catalog hasFormat "Physical measurement and analysis of thin films.".
- catalog isFormatOf "Physical measurement and analysis of thin films.".
- catalog isPartOf "Progress in analytical chemistry v. 2".
- catalog issued "1969".
- catalog issued "1969.".
- catalog language "eng".
- catalog publisher "New York, Plenum Press,".
- catalog relation "Physical measurement and analysis of thin films.".
- catalog subject "530.4/1".
- catalog subject "Absorptiometry, Photon Congresses.".
- catalog subject "Chemistry Techniques, Analytical Congresses.".
- catalog subject "Electron Probe Microanalysis Congresses.".
- catalog subject "QC176 .E2 1967".
- catalog subject "Thin films.".
- catalog subject "W3 PR9455 v.2 1967".
- catalog tableOfContents "Nondestructive optical techniques for thin-film thickness measurements / by W.A. Pliskin -- A review of x-ray methods for investigating thin films and platings / by Eugene P. Bertin -- X-ray fluorescence and electron microprobe techniques for determination of thin-film thickness / by James E. Cline -- Density determination of sputtered tantalum films by a beta-backscatter technique / by Richard Brown -- The characterization of solid thin films and surfaces by electron microscopy and diffraction / by R.B. Marcus -- The emission-spectrographic and atomic-absorption analyses of metallic thin films / by J.D. Nohe -- RF spark source mass spectrometry for the analysis of surface films / by D.L. Malm -- Chemical and structural evaluation of thin glass films / by W.A. Pliskin.".
- catalog title "Physical measurement and analysis of thin films, edited by E. M. Murt and W. G. Guldner.".
- catalog type "text".