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- catalog alternative "Physics of failure in electronics.".
- catalog contributor b9821062.
- catalog contributor b9821063.
- catalog contributor b9821064.
- catalog date "1968".
- catalog description "Includes bibliographies.".
- catalog description "Sponsored by the IEEE Electronic Devices Group and the IEEE Reliability Group.".
- catalog extent "v.".
- catalog identifier "0080-0821".
- catalog issued "1968".
- catalog language "eng".
- catalog publisher "[New York] Institute of Electrical and Electronics Engineers, Electronic Devices and Reliability Groups.".
- catalog relation "Proceedings".
- catalog replaces "Proceedings".
- catalog subject "Electronic apparatus and appliances Reliability Congresses.".
- catalog subject "Electronic apparatus and appliances Testing Congresses.".
- catalog title "Presentation abstracts - Reliability Physics Symposium.".
- catalog type "text".