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- catalog contributor b9843421.
- catalog contributor b9843422.
- catalog contributor b9843423.
- catalog contributor b9843424.
- catalog contributor b9843425.
- catalog contributor b9843426.
- catalog created "1996.".
- catalog date "1996".
- catalog date "1996.".
- catalog dateCopyrighted "1996.".
- catalog description "Includes bibliographical references and index.".
- catalog extent "226 p. :".
- catalog hasFormat "In situ electron and tunneling microscopy of dynamic processes.".
- catalog identifier "155899307X (alk. paper)".
- catalog isFormatOf "In situ electron and tunneling microscopy of dynamic processes.".
- catalog isPartOf "Materials Research Society symposia proceedings ; v. 404.".
- catalog isPartOf "Materials Research Society symposium proceedings ; v. 404".
- catalog issued "1996".
- catalog issued "1996.".
- catalog language "eng".
- catalog publisher "Pittsburgh, Pa. : Materials Research Society,".
- catalog relation "In situ electron and tunneling microscopy of dynamic processes.".
- catalog subject "620.1/127 20".
- catalog subject "Electron microscopy Technique Congresses.".
- catalog subject "Image processing Congresses.".
- catalog subject "QC173.4.S94 I5 1996".
- catalog subject "Surfaces (Physics) Optical properties Congresses.".
- catalog subject "Surfaces (Technology) Congresses.".
- catalog title "In situ electron and tunneling microscopy of dynamic processes : symposium held November 27-30, 1995, Boston, Massachusetts, U.S.A. / editors, Renu Sharma ... [et al.].".
- catalog type "Boston (Mass., 1995) swd".
- catalog type "Conference proceedings. fast".
- catalog type "text".