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- catalog contributor b9978487.
- catalog created "1974.".
- catalog date "1974".
- catalog date "1974.".
- catalog dateCopyrighted "1974.".
- catalog extent "iv, 18 p.".
- catalog isPartOf "NBS Special publication ; 400-3".
- catalog isPartOf "NBS special publication ; 400-3.".
- catalog isPartOf "Semiconductor measurement technology".
- catalog issued "1974".
- catalog issued "1974.".
- catalog language "eng".
- catalog publisher "[Washington] U.S. National Bureau of Standards; [for sale by the Supt. of Docs., U.S. Govt. Print. Off.]".
- catalog subject "389/.08 s 621.381/73".
- catalog subject "Electronic measurements Congresses.".
- catalog subject "Integrated circuits Congresses.".
- catalog subject "QC100 .U57 no. 400-3 TK7874".
- catalog subject "Semiconductors Congresses.".
- catalog title "ARPA/NBS workshop I: measurement problems in integrated circuit processing and assembly [by] Harry A. Schafft.".
- catalog type "text".