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- catalog contributor b9978490.
- catalog contributor b9978491.
- catalog created "1975.".
- catalog date "1975".
- catalog date "1975.".
- catalog dateCopyrighted "1975.".
- catalog description "Includes bibliographical references.".
- catalog extent "iv, 20 p. :".
- catalog isPartOf "NBS special publication ; 400-13.".
- catalog isPartOf "National Bureau of Standards special publication ; 400-13".
- catalog isPartOf "Semiconductor measurement technology".
- catalog issued "1975".
- catalog issued "1975.".
- catalog language "eng".
- catalog publisher "Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- catalog subject "389/.08 s 621.3815/22".
- catalog subject "Germanium diodes Defects.".
- catalog subject "Infrared technology.".
- catalog subject "QC100 .U57 no. 400-13 TK7871.86".
- catalog subject "Silicon diodes Defects.".
- catalog title "Improved infrared response technique for detecting defects and impurities in germanium and silicon p-i-n diodes / A. H. Sher ; sponsored by U.S. Atomic Energy Commission.".
- catalog type "text".