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- catalog contributor b9978495.
- catalog created "1974.".
- catalog date "1974".
- catalog date "1974.".
- catalog dateCopyrighted "1974.".
- catalog extent "36 p. :".
- catalog isPartOf "NBS Special publication ; 400-9".
- catalog isPartOf "NBS special publication ; 400-9.".
- catalog isPartOf "Semiconductor measurement technology".
- catalog issued "1974".
- catalog issued "1974.".
- catalog language "eng".
- catalog publisher "Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs. U.S. Govt. Print. Off.,".
- catalog subject "389/.08 s 621.381/73".
- catalog subject "Integrated circuits Testing Congresses.".
- catalog subject "QC100 .U57 no. 400-9 TK7874".
- catalog subject "Sealing (Technology) Congresses.".
- catalog subject "Semiconductors Testing Congresses.".
- catalog title "ARPA/NBS workshop II : hermeticity testing for integrated circuits : [synopses] / Harry A. Schafft.".
- catalog type "text".