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- catalog contributor b9978496.
- catalog contributor b9978497.
- catalog contributor b9978498.
- catalog contributor b9978499.
- catalog created "1975.".
- catalog date "1975".
- catalog date "1975.".
- catalog dateCopyrighted "1975.".
- catalog description "Includes bibliographical references.".
- catalog extent "v, 33 p. :".
- catalog hasFormat "BASIC program for calculating dopant density profiles from capacitance-voltage data.".
- catalog isFormatOf "BASIC program for calculating dopant density profiles from capacitance-voltage data.".
- catalog isPartOf "NBS special publication ; 400-11.".
- catalog isPartOf "National Bureau of Standards special publication ; 400-11".
- catalog isPartOf "Semiconductor measurement technology".
- catalog issued "1975".
- catalog issued "1975.".
- catalog language "eng".
- catalog publisher "Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- catalog relation "BASIC program for calculating dopant density profiles from capacitance-voltage data.".
- catalog subject "389/.08 s 621.3815/.2/028".
- catalog subject "BASIC (Computer program language)".
- catalog subject "Diodes, Semiconductor Data processing.".
- catalog subject "Electric measurements Data processing.".
- catalog subject "Ion implantation Data processing.".
- catalog subject "QC100 .U57 no. 400-11 TK7871.85".
- catalog title "A BASIC program for calculating dopant density profiles from capacitance-voltage data / Richard L. Mattis and Martin G. Buehler.".
- catalog type "text".