Matches in Harvard for { <http://id.lib.harvard.edu/aleph/007220586/catalog> ?p ?o. }
Showing items 1 to 20 of
20
with 100 items per page.
- catalog contributor b9978518.
- catalog created "1976.".
- catalog date "1976".
- catalog date "1976.".
- catalog dateCopyrighted "1976.".
- catalog description "Includes bibliographical references.".
- catalog extent "v, 46 p. :".
- catalog isPartOf "NBS special publication ; 400-15".
- catalog isPartOf "Semiconductor measurement technology".
- catalog issued "1976".
- catalog issued "1976.".
- catalog language "eng".
- catalog publisher "Washington : U.S. Dept. of Commerce, National Bureau of Standards : for sale by the Supt. of Docs., U.S. Govt. Print. Off.,".
- catalog subject "602.1 s 621.381/73".
- catalog subject "Automatic data collection systems Congresses.".
- catalog subject "Electronic industries Quality control Congresses.".
- catalog subject "Integrated circuits Testing Congresses.".
- catalog subject "QC100 .U57 no. 400-15 TK7874".
- catalog title "ARPA/NBS workshop III : test patterns for integrated circuits / Harry A. Schafft, editor.".
- catalog type "text".