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- catalog alternative "Experimental and theoretic aspects of image analysis.".
- catalog alternative "Image analysis".
- catalog contributor b10194120.
- catalog contributor b10194121.
- catalog created "1996.".
- catalog date "1996".
- catalog date "1996.".
- catalog dateCopyrighted "1996.".
- catalog description "Includes bibliographical references and index.".
- catalog description "Introduction -- Physical phenomena relevant to STM and AFM -- Scanning probe microscopes -- Practical aspects of STM and AFM measurements -- Simulations of STM and AFM images -- STM and AFM images of layered inorganic compounds -- STM images associated with point defects of layered inorganic compounds -- Surface relaxation in STM and AFM images -- Organic conducting salts -- Organic adsorbates at liquid/solid interfaces -- Self-assembled structures -- Polymers.".
- catalog extent "xii, 323 p. :".
- catalog hasFormat "Surface analysis with STM and AFM.".
- catalog identifier "3527293132".
- catalog isFormatOf "Surface analysis with STM and AFM.".
- catalog issued "1996".
- catalog issued "1996.".
- catalog language "eng".
- catalog publisher "Weinheim ; New York : VCH,".
- catalog relation "Surface analysis with STM and AFM.".
- catalog subject "Atomic force microscopy.".
- catalog subject "Electric insulators and insulation Testing.".
- catalog subject "Metals Surfaces Analysis.".
- catalog subject "Scanning tunneling microscopy.".
- catalog subject "Semiconductors Testing.".
- catalog subject "Surfaces (Technology) Analysis.".
- catalog subject "TA418.7 .M34 1996".
- catalog tableOfContents "Introduction -- Physical phenomena relevant to STM and AFM -- Scanning probe microscopes -- Practical aspects of STM and AFM measurements -- Simulations of STM and AFM images -- STM and AFM images of layered inorganic compounds -- STM images associated with point defects of layered inorganic compounds -- Surface relaxation in STM and AFM images -- Organic conducting salts -- Organic adsorbates at liquid/solid interfaces -- Self-assembled structures -- Polymers.".
- catalog title "Experimental and theoretic aspects of image analysis.".
- catalog title "Image analysis".
- catalog title "Surface analysis with STM and AFM : experimental and theoretical aspects of image analysis / Sergei N. Magonov, Myung-Hwan Whangbo.".
- catalog type "text".